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Structural, Electronic and Optical Characterization of ZnO Thin Film-Seeded Platforms for ZnO Nanostructures: Sol–Gel Method Versus Ab Initio Calculations
Zinc oxide thin films were prepared on glass substrates by sol–gel dip coating technique. ZnO solution was prepared using zinc acetate dihydrate, ethanol and ethanolamine as the starting material, solvent and solution stabilizer, respectively. The samples were annealed at various temperatures for va...
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| Published in: | Journal of electronic materials 2019-08, Vol.48 (8), p.5028-5038 |
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| Main Authors: | , , , |
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| cites | cdi_FETCH-LOGICAL-c319t-fd0ac5a1b5c8f33ee64d585275fdf020248e59d907bf54abaae317e7603771283 |
| container_end_page | 5038 |
| container_issue | 8 |
| container_start_page | 5028 |
| container_title | Journal of electronic materials |
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| creator | Al-Bataineh, Qais M. Alsaad, A. M. Ahmad, A. A. Al-Sawalmih, A. |
| description | Zinc oxide thin films were prepared on glass substrates by sol–gel dip coating technique. ZnO solution was prepared using zinc acetate dihydrate, ethanol and ethanolamine as the starting material, solvent and solution stabilizer, respectively. The samples were annealed at various temperatures for various times to reach the best structure for ZnO. X-ray powder diffraction, scanning electron microscopy and energy dispersive x-ray analysis were used to investigate the structural properties. Upon annealing, we found that the films exhibit a hexagonal structure. Vienna
ab initio
simulation package based on density functional theory and generalized gradient approximation was used to investigate the structural and electronic properties of wurtzite ZnO structures. The experimental lattice parameters of our samples are found to be in good agreement with
ab initio
calculated parameters. The ultraviolet–visible spectroscopy (UV–Vis) spectrophotometer measurements were performed to investigate the optical properties of ZnO thin films. We found that the index of refraction of annealed ZnO thin films exhibits values ranging between 1.5 and 2.2. Our structural and optical results indicate that ZnO films could be used as seeded platforms for growing ZnO nanostructures using a simple hydrothermal method. |
| doi_str_mv | 10.1007/s11664-019-07303-6 |
| format | article |
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ab initio
simulation package based on density functional theory and generalized gradient approximation was used to investigate the structural and electronic properties of wurtzite ZnO structures. The experimental lattice parameters of our samples are found to be in good agreement with
ab initio
calculated parameters. The ultraviolet–visible spectroscopy (UV–Vis) spectrophotometer measurements were performed to investigate the optical properties of ZnO thin films. We found that the index of refraction of annealed ZnO thin films exhibits values ranging between 1.5 and 2.2. Our structural and optical results indicate that ZnO films could be used as seeded platforms for growing ZnO nanostructures using a simple hydrothermal method.</description><identifier>ISSN: 0361-5235</identifier><identifier>EISSN: 1543-186X</identifier><identifier>DOI: 10.1007/s11664-019-07303-6</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Annealing ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Density functional theory ; Electronics and Microelectronics ; Ethanol ; Glass substrates ; Immersion coating ; Instrumentation ; Lattice parameters ; Materials Science ; Mathematical analysis ; Nanostructure ; Optical and Electronic Materials ; Optical properties ; Photovoltaic cells ; Platforms ; Refractivity ; Scanning electron microscopy ; Sol-gel processes ; Solid State Physics ; Structural analysis ; Thin films ; Wurtzite ; X ray analysis ; X ray powder diffraction ; Zinc acetate ; Zinc oxide ; Zinc oxides</subject><ispartof>Journal of electronic materials, 2019-08, Vol.48 (8), p.5028-5038</ispartof><rights>The Minerals, Metals & Materials Society 2019</rights><rights>Journal of Electronic Materials is a copyright of Springer, (2019). All Rights Reserved.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c319t-fd0ac5a1b5c8f33ee64d585275fdf020248e59d907bf54abaae317e7603771283</citedby><cites>FETCH-LOGICAL-c319t-fd0ac5a1b5c8f33ee64d585275fdf020248e59d907bf54abaae317e7603771283</cites><orcidid>0000-0003-1721-1878</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>315,786,790,27957,27958</link.rule.ids></links><search><creatorcontrib>Al-Bataineh, Qais M.</creatorcontrib><creatorcontrib>Alsaad, A. M.</creatorcontrib><creatorcontrib>Ahmad, A. A.</creatorcontrib><creatorcontrib>Al-Sawalmih, A.</creatorcontrib><title>Structural, Electronic and Optical Characterization of ZnO Thin Film-Seeded Platforms for ZnO Nanostructures: Sol–Gel Method Versus Ab Initio Calculations</title><title>Journal of electronic materials</title><addtitle>Journal of Elec Materi</addtitle><description>Zinc oxide thin films were prepared on glass substrates by sol–gel dip coating technique. ZnO solution was prepared using zinc acetate dihydrate, ethanol and ethanolamine as the starting material, solvent and solution stabilizer, respectively. The samples were annealed at various temperatures for various times to reach the best structure for ZnO. X-ray powder diffraction, scanning electron microscopy and energy dispersive x-ray analysis were used to investigate the structural properties. Upon annealing, we found that the films exhibit a hexagonal structure. Vienna
ab initio
simulation package based on density functional theory and generalized gradient approximation was used to investigate the structural and electronic properties of wurtzite ZnO structures. The experimental lattice parameters of our samples are found to be in good agreement with
ab initio
calculated parameters. The ultraviolet–visible spectroscopy (UV–Vis) spectrophotometer measurements were performed to investigate the optical properties of ZnO thin films. We found that the index of refraction of annealed ZnO thin films exhibits values ranging between 1.5 and 2.2. Our structural and optical results indicate that ZnO films could be used as seeded platforms for growing ZnO nanostructures using a simple hydrothermal method.</description><subject>Annealing</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Density functional theory</subject><subject>Electronics and Microelectronics</subject><subject>Ethanol</subject><subject>Glass substrates</subject><subject>Immersion coating</subject><subject>Instrumentation</subject><subject>Lattice parameters</subject><subject>Materials Science</subject><subject>Mathematical analysis</subject><subject>Nanostructure</subject><subject>Optical and Electronic Materials</subject><subject>Optical properties</subject><subject>Photovoltaic cells</subject><subject>Platforms</subject><subject>Refractivity</subject><subject>Scanning electron microscopy</subject><subject>Sol-gel processes</subject><subject>Solid State Physics</subject><subject>Structural analysis</subject><subject>Thin films</subject><subject>Wurtzite</subject><subject>X ray analysis</subject><subject>X ray powder diffraction</subject><subject>Zinc acetate</subject><subject>Zinc oxide</subject><subject>Zinc oxides</subject><issn>0361-5235</issn><issn>1543-186X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp9kb1OHDEUha0okbKBvACVJdoYfMdjz2w6tOJPImykJQjRWF7PNTvIa29sT0Eq3oE2T8eTZLKLlC7Nvc13zik-Qg6AHwHnzXEGUKpmHKaMN4ILpt6RCchaMGjV3Xsy4UIBk5WQH8mnnB85BwktTMjvRUmDLUMy_gs99WhLiqG31ISOzjelt8bT2cokYwum_pcpfQw0Onof5vRm1Qd61vs1WyB22NHv3hQX0zrT8W6RaxNiflvA_JUuon99fjlHT79hWcWO3mLKQ6YnS3oZ-rGczoy3g9_u5H3ywRmf8fPb3yM_zk5vZhfsan5-OTu5YlbAtDDXcWOlgaW0rRMCUdWdbGXVSNc5XvGqblFOuylvlk7WZmkMCmiwUVw0DVSt2COHu95Nij8HzEU_xiGFcVJXlQAlAUQ9UtWOsinmnNDpTerXJj1p4PqvBb2zoEcLemtBqzEkdqE8wuEB07_q_6T-AK61jVk</recordid><startdate>20190801</startdate><enddate>20190801</enddate><creator>Al-Bataineh, Qais M.</creator><creator>Alsaad, A. 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M. ; Ahmad, A. A. ; Al-Sawalmih, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c319t-fd0ac5a1b5c8f33ee64d585275fdf020248e59d907bf54abaae317e7603771283</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Annealing</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Density functional theory</topic><topic>Electronics and Microelectronics</topic><topic>Ethanol</topic><topic>Glass substrates</topic><topic>Immersion coating</topic><topic>Instrumentation</topic><topic>Lattice parameters</topic><topic>Materials Science</topic><topic>Mathematical analysis</topic><topic>Nanostructure</topic><topic>Optical and Electronic Materials</topic><topic>Optical properties</topic><topic>Photovoltaic cells</topic><topic>Platforms</topic><topic>Refractivity</topic><topic>Scanning electron microscopy</topic><topic>Sol-gel processes</topic><topic>Solid State Physics</topic><topic>Structural analysis</topic><topic>Thin films</topic><topic>Wurtzite</topic><topic>X ray analysis</topic><topic>X ray powder diffraction</topic><topic>Zinc acetate</topic><topic>Zinc oxide</topic><topic>Zinc oxides</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Al-Bataineh, Qais M.</creatorcontrib><creatorcontrib>Alsaad, A. 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A.</creatorcontrib><creatorcontrib>Al-Sawalmih, A.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>STEM Database</collection><collection>ProQuest Pharma Collection</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>AUTh Library subscriptions: ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>ProQuest research library</collection><collection>ProQuest Science Journals</collection><collection>ProQuest Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>ProQuest Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>SIRS Editorial</collection><jtitle>Journal of electronic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Al-Bataineh, Qais M.</au><au>Alsaad, A. M.</au><au>Ahmad, A. A.</au><au>Al-Sawalmih, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural, Electronic and Optical Characterization of ZnO Thin Film-Seeded Platforms for ZnO Nanostructures: Sol–Gel Method Versus Ab Initio Calculations</atitle><jtitle>Journal of electronic materials</jtitle><stitle>Journal of Elec Materi</stitle><date>2019-08-01</date><risdate>2019</risdate><volume>48</volume><issue>8</issue><spage>5028</spage><epage>5038</epage><pages>5028-5038</pages><issn>0361-5235</issn><eissn>1543-186X</eissn><abstract>Zinc oxide thin films were prepared on glass substrates by sol–gel dip coating technique. ZnO solution was prepared using zinc acetate dihydrate, ethanol and ethanolamine as the starting material, solvent and solution stabilizer, respectively. The samples were annealed at various temperatures for various times to reach the best structure for ZnO. X-ray powder diffraction, scanning electron microscopy and energy dispersive x-ray analysis were used to investigate the structural properties. Upon annealing, we found that the films exhibit a hexagonal structure. Vienna
ab initio
simulation package based on density functional theory and generalized gradient approximation was used to investigate the structural and electronic properties of wurtzite ZnO structures. The experimental lattice parameters of our samples are found to be in good agreement with
ab initio
calculated parameters. The ultraviolet–visible spectroscopy (UV–Vis) spectrophotometer measurements were performed to investigate the optical properties of ZnO thin films. We found that the index of refraction of annealed ZnO thin films exhibits values ranging between 1.5 and 2.2. Our structural and optical results indicate that ZnO films could be used as seeded platforms for growing ZnO nanostructures using a simple hydrothermal method.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s11664-019-07303-6</doi><tpages>11</tpages><orcidid>https://orcid.org/0000-0003-1721-1878</orcidid></addata></record> |
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| subjects | Annealing Characterization and Evaluation of Materials Chemistry and Materials Science Density functional theory Electronics and Microelectronics Ethanol Glass substrates Immersion coating Instrumentation Lattice parameters Materials Science Mathematical analysis Nanostructure Optical and Electronic Materials Optical properties Photovoltaic cells Platforms Refractivity Scanning electron microscopy Sol-gel processes Solid State Physics Structural analysis Thin films Wurtzite X ray analysis X ray powder diffraction Zinc acetate Zinc oxide Zinc oxides |
| title | Structural, Electronic and Optical Characterization of ZnO Thin Film-Seeded Platforms for ZnO Nanostructures: Sol–Gel Method Versus Ab Initio Calculations |
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