Loading…

1.3 mu m InGaAs MSM photodetector with abrupt InGaAs/AlInAs interface

The authors have fabricated long-wavelength abrupt-junction InGaAs/AlInAs metal-semiconductor-metal photodetectors that are potentially compatible with AlInAs/InGaAs H-MESFETs. The detectors have nanoampere dark currents and low capacitance. The responsivity at 10 MHz is 0.32 A/W, corresponding to a...

Full description

Saved in:
Bibliographic Details
Published in:IEEE photonics technology letters 1991-06, Vol.3 (6), p.532-534
Main Authors: Burroughes, J.H., Hargis, M.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c243t-2558a2e5f7b5827a6b959e351c1d95f02dddb8ae2e3f295f8cfd7ef4ec7cf01b3
cites cdi_FETCH-LOGICAL-c243t-2558a2e5f7b5827a6b959e351c1d95f02dddb8ae2e3f295f8cfd7ef4ec7cf01b3
container_end_page 534
container_issue 6
container_start_page 532
container_title IEEE photonics technology letters
container_volume 3
creator Burroughes, J.H.
Hargis, M.
description The authors have fabricated long-wavelength abrupt-junction InGaAs/AlInAs metal-semiconductor-metal photodetectors that are potentially compatible with AlInAs/InGaAs H-MESFETs. The detectors have nanoampere dark currents and low capacitance. The responsivity at 10 MHz is 0.32 A/W, corresponding to at least 90% internal collection efficiency. The device performance limitations due to charge storage at the InGaAs/AlInAs interface are discussed, and it is shown that despite charge pile up, high data rates (>3 GHz) have been achieved at low bias voltages, provided the incident intensity is low.< >
doi_str_mv 10.1109/68.91025
format article
fullrecord <record><control><sourceid>crossref_ieee_</sourceid><recordid>TN_cdi_ieee_primary_91025</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>91025</ieee_id><sourcerecordid>10_1109_68_91025</sourcerecordid><originalsourceid>FETCH-LOGICAL-c243t-2558a2e5f7b5827a6b959e351c1d95f02dddb8ae2e3f295f8cfd7ef4ec7cf01b3</originalsourceid><addsrcrecordid>eNo9z8tLw0AQBvBFFKxV8Optj16S7uwjj2MotQZaPKjnsNnM0kjzYHeL-N8bm-JpPmZ-DHyEPAKLAVi-SrI4B8bVFVlALiFikMrrKbMpAwh1S-68_2IMpBJyQTYQC9qdaEfLfqsLT_fvezoehjA0GNCEwdHvNhyort1pDBe0Ko5lP9m2D-isNnhPbqw-eny4zCX5fNl8rF-j3du2XBe7yHApQsSVyjRHZdNaZTzVSZ2rHIUCA02uLONN09SZRo7C8mmRGdukaCWa1FgGtViS5_mvcYP3Dm01urbT7qcCVv3Vr5KsOtef6NNMW0T8Z_PtF38YU5g</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>1.3 mu m InGaAs MSM photodetector with abrupt InGaAs/AlInAs interface</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Burroughes, J.H. ; Hargis, M.</creator><creatorcontrib>Burroughes, J.H. ; Hargis, M.</creatorcontrib><description>The authors have fabricated long-wavelength abrupt-junction InGaAs/AlInAs metal-semiconductor-metal photodetectors that are potentially compatible with AlInAs/InGaAs H-MESFETs. The detectors have nanoampere dark currents and low capacitance. The responsivity at 10 MHz is 0.32 A/W, corresponding to at least 90% internal collection efficiency. The device performance limitations due to charge storage at the InGaAs/AlInAs interface are discussed, and it is shown that despite charge pile up, high data rates (&gt;3 GHz) have been achieved at low bias voltages, provided the incident intensity is low.&lt; &gt;</description><identifier>ISSN: 1041-1135</identifier><identifier>EISSN: 1941-0174</identifier><identifier>DOI: 10.1109/68.91025</identifier><identifier>CODEN: IPTLEL</identifier><language>eng</language><publisher>IEEE</publisher><subject>Capacitance ; Dark current ; Fingers ; Gallium arsenide ; Indium gallium arsenide ; Indium phosphide ; Photodetectors ; PIN photodiodes ; Substrates ; Wet etching</subject><ispartof>IEEE photonics technology letters, 1991-06, Vol.3 (6), p.532-534</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c243t-2558a2e5f7b5827a6b959e351c1d95f02dddb8ae2e3f295f8cfd7ef4ec7cf01b3</citedby><cites>FETCH-LOGICAL-c243t-2558a2e5f7b5827a6b959e351c1d95f02dddb8ae2e3f295f8cfd7ef4ec7cf01b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/91025$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>315,786,790,27957,27958,55147</link.rule.ids></links><search><creatorcontrib>Burroughes, J.H.</creatorcontrib><creatorcontrib>Hargis, M.</creatorcontrib><title>1.3 mu m InGaAs MSM photodetector with abrupt InGaAs/AlInAs interface</title><title>IEEE photonics technology letters</title><addtitle>LPT</addtitle><description>The authors have fabricated long-wavelength abrupt-junction InGaAs/AlInAs metal-semiconductor-metal photodetectors that are potentially compatible with AlInAs/InGaAs H-MESFETs. The detectors have nanoampere dark currents and low capacitance. The responsivity at 10 MHz is 0.32 A/W, corresponding to at least 90% internal collection efficiency. The device performance limitations due to charge storage at the InGaAs/AlInAs interface are discussed, and it is shown that despite charge pile up, high data rates (&gt;3 GHz) have been achieved at low bias voltages, provided the incident intensity is low.&lt; &gt;</description><subject>Capacitance</subject><subject>Dark current</subject><subject>Fingers</subject><subject>Gallium arsenide</subject><subject>Indium gallium arsenide</subject><subject>Indium phosphide</subject><subject>Photodetectors</subject><subject>PIN photodiodes</subject><subject>Substrates</subject><subject>Wet etching</subject><issn>1041-1135</issn><issn>1941-0174</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1991</creationdate><recordtype>article</recordtype><recordid>eNo9z8tLw0AQBvBFFKxV8Optj16S7uwjj2MotQZaPKjnsNnM0kjzYHeL-N8bm-JpPmZ-DHyEPAKLAVi-SrI4B8bVFVlALiFikMrrKbMpAwh1S-68_2IMpBJyQTYQC9qdaEfLfqsLT_fvezoehjA0GNCEwdHvNhyort1pDBe0Ko5lP9m2D-isNnhPbqw-eny4zCX5fNl8rF-j3du2XBe7yHApQsSVyjRHZdNaZTzVSZ2rHIUCA02uLONN09SZRo7C8mmRGdukaCWa1FgGtViS5_mvcYP3Dm01urbT7qcCVv3Vr5KsOtef6NNMW0T8Z_PtF38YU5g</recordid><startdate>19910601</startdate><enddate>19910601</enddate><creator>Burroughes, J.H.</creator><creator>Hargis, M.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19910601</creationdate><title>1.3 mu m InGaAs MSM photodetector with abrupt InGaAs/AlInAs interface</title><author>Burroughes, J.H. ; Hargis, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c243t-2558a2e5f7b5827a6b959e351c1d95f02dddb8ae2e3f295f8cfd7ef4ec7cf01b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1991</creationdate><topic>Capacitance</topic><topic>Dark current</topic><topic>Fingers</topic><topic>Gallium arsenide</topic><topic>Indium gallium arsenide</topic><topic>Indium phosphide</topic><topic>Photodetectors</topic><topic>PIN photodiodes</topic><topic>Substrates</topic><topic>Wet etching</topic><toplevel>online_resources</toplevel><creatorcontrib>Burroughes, J.H.</creatorcontrib><creatorcontrib>Hargis, M.</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE photonics technology letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Burroughes, J.H.</au><au>Hargis, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>1.3 mu m InGaAs MSM photodetector with abrupt InGaAs/AlInAs interface</atitle><jtitle>IEEE photonics technology letters</jtitle><stitle>LPT</stitle><date>1991-06-01</date><risdate>1991</risdate><volume>3</volume><issue>6</issue><spage>532</spage><epage>534</epage><pages>532-534</pages><issn>1041-1135</issn><eissn>1941-0174</eissn><coden>IPTLEL</coden><abstract>The authors have fabricated long-wavelength abrupt-junction InGaAs/AlInAs metal-semiconductor-metal photodetectors that are potentially compatible with AlInAs/InGaAs H-MESFETs. The detectors have nanoampere dark currents and low capacitance. The responsivity at 10 MHz is 0.32 A/W, corresponding to at least 90% internal collection efficiency. The device performance limitations due to charge storage at the InGaAs/AlInAs interface are discussed, and it is shown that despite charge pile up, high data rates (&gt;3 GHz) have been achieved at low bias voltages, provided the incident intensity is low.&lt; &gt;</abstract><pub>IEEE</pub><doi>10.1109/68.91025</doi><tpages>3</tpages></addata></record>
fulltext fulltext
identifier ISSN: 1041-1135
ispartof IEEE photonics technology letters, 1991-06, Vol.3 (6), p.532-534
issn 1041-1135
1941-0174
language eng
recordid cdi_ieee_primary_91025
source IEEE Electronic Library (IEL) Journals
subjects Capacitance
Dark current
Fingers
Gallium arsenide
Indium gallium arsenide
Indium phosphide
Photodetectors
PIN photodiodes
Substrates
Wet etching
title 1.3 mu m InGaAs MSM photodetector with abrupt InGaAs/AlInAs interface
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-09-22T09%3A28%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_ieee_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=1.3%20mu%20m%20InGaAs%20MSM%20photodetector%20with%20abrupt%20InGaAs/AlInAs%20interface&rft.jtitle=IEEE%20photonics%20technology%20letters&rft.au=Burroughes,%20J.H.&rft.date=1991-06-01&rft.volume=3&rft.issue=6&rft.spage=532&rft.epage=534&rft.pages=532-534&rft.issn=1041-1135&rft.eissn=1941-0174&rft.coden=IPTLEL&rft_id=info:doi/10.1109/68.91025&rft_dat=%3Ccrossref_ieee_%3E10_1109_68_91025%3C/crossref_ieee_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c243t-2558a2e5f7b5827a6b959e351c1d95f02dddb8ae2e3f295f8cfd7ef4ec7cf01b3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=91025&rfr_iscdi=true