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P-32: A New Driving Pixel Circuit to Alleviate AMOLED Degradation

This study proposes a new driving pixel circuit in an active matrix organic light‐emitting diode (AMOLED). It is designed to decrease current density and supply the operation of negative bias stress for alleviating OLED degradation, while is capable of improving threshold voltage (Vth) shift of thin...

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Published in:SID International Symposium Digest of technical papers 2010-05, Vol.41 (1), p.1340-1342
Main Authors: Lee, Kuei-Yu, Chang, Jui-Hsin, Chao, Paul C.-P., Chen, Fang-Chung
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Language:English
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cited_by cdi_FETCH-LOGICAL-c2222-a13549050b06de21b45a6bcef9bf062b2828872b73fe2255ef08123d2db6954e3
cites cdi_FETCH-LOGICAL-c2222-a13549050b06de21b45a6bcef9bf062b2828872b73fe2255ef08123d2db6954e3
container_end_page 1342
container_issue 1
container_start_page 1340
container_title SID International Symposium Digest of technical papers
container_volume 41
creator Lee, Kuei-Yu
Chang, Jui-Hsin
Chao, Paul C.-P.
Chen, Fang-Chung
description This study proposes a new driving pixel circuit in an active matrix organic light‐emitting diode (AMOLED). It is designed to decrease current density and supply the operation of negative bias stress for alleviating OLED degradation, while is capable of improving threshold voltage (Vth) shift of thin film transistors (TFTs) by current‐mode compensation circuit.
doi_str_mv 10.1889/1.3499944
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fullrecord <record><control><sourceid>wiley_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1889_1_3499944</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>SDTP2872</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2222-a13549050b06de21b45a6bcef9bf062b2828872b73fe2255ef08123d2db6954e3</originalsourceid><addsrcrecordid>eNp1jztPwzAUhS0EEqUw8A-8Mrj1OzZb1NDyKG0kSulmOYlTGUKLnNDHvyeoFRtnucv33aMDwDXBPaKU7pMe41przk9AhxKpECZCn4IOxjpCWsrFObio63eMGeNcd0CcIkZvYQwnbguT4Dd-tYSp37kKDnzIv30DmzWMq8ptvG0cjJ-n47sEJm4ZbGEbv15dgrPSVrW7Ot4ueB3ezQb3aDwdPQziMcppG2QJE1xjgTMsC0dJxoWVWe5KnZVY0owqqlREs4iVjlIhXIkVoaygRSa14I51wc3hbx7WdR1cab6C_7Rhbwg2v9sNMcftLds_sFtfuf3_oHlJZilta1sDHQxfN273Z9jwYWTEImHeJiMznA-fHucqNQv2A9nhZig</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>P-32: A New Driving Pixel Circuit to Alleviate AMOLED Degradation</title><source>Wiley-Blackwell Journals</source><creator>Lee, Kuei-Yu ; Chang, Jui-Hsin ; Chao, Paul C.-P. ; Chen, Fang-Chung</creator><creatorcontrib>Lee, Kuei-Yu ; Chang, Jui-Hsin ; Chao, Paul C.-P. ; Chen, Fang-Chung</creatorcontrib><description>This study proposes a new driving pixel circuit in an active matrix organic light‐emitting diode (AMOLED). It is designed to decrease current density and supply the operation of negative bias stress for alleviating OLED degradation, while is capable of improving threshold voltage (Vth) shift of thin film transistors (TFTs) by current‐mode compensation circuit.</description><identifier>ISSN: 0097-966X</identifier><identifier>EISSN: 2168-0159</identifier><identifier>DOI: 10.1889/1.3499944</identifier><language>eng</language><publisher>Oxford, UK: Blackwell Publishing Ltd</publisher><ispartof>SID International Symposium Digest of technical papers, 2010-05, Vol.41 (1), p.1340-1342</ispartof><rights>2010 Society for Information Display</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2222-a13549050b06de21b45a6bcef9bf062b2828872b73fe2255ef08123d2db6954e3</citedby><cites>FETCH-LOGICAL-c2222-a13549050b06de21b45a6bcef9bf062b2828872b73fe2255ef08123d2db6954e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1889%2F1.3499944$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1889%2F1.3499944$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>315,786,790,27957,27958,50923,51032</link.rule.ids></links><search><creatorcontrib>Lee, Kuei-Yu</creatorcontrib><creatorcontrib>Chang, Jui-Hsin</creatorcontrib><creatorcontrib>Chao, Paul C.-P.</creatorcontrib><creatorcontrib>Chen, Fang-Chung</creatorcontrib><title>P-32: A New Driving Pixel Circuit to Alleviate AMOLED Degradation</title><title>SID International Symposium Digest of technical papers</title><description>This study proposes a new driving pixel circuit in an active matrix organic light‐emitting diode (AMOLED). It is designed to decrease current density and supply the operation of negative bias stress for alleviating OLED degradation, while is capable of improving threshold voltage (Vth) shift of thin film transistors (TFTs) by current‐mode compensation circuit.</description><issn>0097-966X</issn><issn>2168-0159</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNp1jztPwzAUhS0EEqUw8A-8Mrj1OzZb1NDyKG0kSulmOYlTGUKLnNDHvyeoFRtnucv33aMDwDXBPaKU7pMe41przk9AhxKpECZCn4IOxjpCWsrFObio63eMGeNcd0CcIkZvYQwnbguT4Dd-tYSp37kKDnzIv30DmzWMq8ptvG0cjJ-n47sEJm4ZbGEbv15dgrPSVrW7Ot4ueB3ezQb3aDwdPQziMcppG2QJE1xjgTMsC0dJxoWVWe5KnZVY0owqqlREs4iVjlIhXIkVoaygRSa14I51wc3hbx7WdR1cab6C_7Rhbwg2v9sNMcftLds_sFtfuf3_oHlJZilta1sDHQxfN273Z9jwYWTEImHeJiMznA-fHucqNQv2A9nhZig</recordid><startdate>201005</startdate><enddate>201005</enddate><creator>Lee, Kuei-Yu</creator><creator>Chang, Jui-Hsin</creator><creator>Chao, Paul C.-P.</creator><creator>Chen, Fang-Chung</creator><general>Blackwell Publishing Ltd</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>201005</creationdate><title>P-32: A New Driving Pixel Circuit to Alleviate AMOLED Degradation</title><author>Lee, Kuei-Yu ; Chang, Jui-Hsin ; Chao, Paul C.-P. ; Chen, Fang-Chung</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2222-a13549050b06de21b45a6bcef9bf062b2828872b73fe2255ef08123d2db6954e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lee, Kuei-Yu</creatorcontrib><creatorcontrib>Chang, Jui-Hsin</creatorcontrib><creatorcontrib>Chao, Paul C.-P.</creatorcontrib><creatorcontrib>Chen, Fang-Chung</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><jtitle>SID International Symposium Digest of technical papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lee, Kuei-Yu</au><au>Chang, Jui-Hsin</au><au>Chao, Paul C.-P.</au><au>Chen, Fang-Chung</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>P-32: A New Driving Pixel Circuit to Alleviate AMOLED Degradation</atitle><jtitle>SID International Symposium Digest of technical papers</jtitle><date>2010-05</date><risdate>2010</risdate><volume>41</volume><issue>1</issue><spage>1340</spage><epage>1342</epage><pages>1340-1342</pages><issn>0097-966X</issn><eissn>2168-0159</eissn><notes>istex:E0BA4F854539F57A22F647A922E3CC8F95A1D45F</notes><notes>ArticleID:SDTP2872</notes><notes>ark:/67375/WNG-FVFKJV8P-X</notes><abstract>This study proposes a new driving pixel circuit in an active matrix organic light‐emitting diode (AMOLED). It is designed to decrease current density and supply the operation of negative bias stress for alleviating OLED degradation, while is capable of improving threshold voltage (Vth) shift of thin film transistors (TFTs) by current‐mode compensation circuit.</abstract><cop>Oxford, UK</cop><pub>Blackwell Publishing Ltd</pub><doi>10.1889/1.3499944</doi><tpages>3</tpages></addata></record>
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title P-32: A New Driving Pixel Circuit to Alleviate AMOLED Degradation
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-09-22T23%3A28%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-wiley_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=P-32:%20A%20New%20Driving%20Pixel%20Circuit%20to%20Alleviate%20AMOLED%20Degradation&rft.jtitle=SID%20International%20Symposium%20Digest%20of%20technical%20papers&rft.au=Lee,%20Kuei-Yu&rft.date=2010-05&rft.volume=41&rft.issue=1&rft.spage=1340&rft.epage=1342&rft.pages=1340-1342&rft.issn=0097-966X&rft.eissn=2168-0159&rft_id=info:doi/10.1889/1.3499944&rft_dat=%3Cwiley_cross%3ESDTP2872%3C/wiley_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c2222-a13549050b06de21b45a6bcef9bf062b2828872b73fe2255ef08123d2db6954e3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true