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Self-Aligned Barrier Improves Interconnect Reliability
by
Hui-Jung, Wu
,
O'loughlin, Jennifer
,
Shaviv, Roey
,
Sriram, Mandyam
,
Chattopadhyay, Kaushik
,
Yongsik Yu,Tom Mountsier,Bart van Schravendijk
,
Varadarajan, Sesha
,
Dixit, Girish
,
Havemann, Robert
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Semiconductor International
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Semiconductor International
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Connectivity
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