Search Results - Yashanin, I. B.

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  1. 1
    The radiation test based assessment of process quality and reliability for conventional 65-nm CMOS technology

    The radiation test based assessment of process quality and reliability for conventional 65-nm CMOS technology by Kessarinskiy, L.N., Davydov, G.G., Boychenko, D.V., Artamonov, A.S., Nikiforov, A.Y., Yashanin, I.B.

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  2. 2
    Total ionizing dose hardness nondestructive individual estimation and predictive grading for silicon-on-insulator ICs

    Total ionizing dose hardness nondestructive individual estimation and predictive grading for silicon-on-insulator ICs by Moskovskaya, Y. M., Davydov, G. G., Sogoyan, A. V., Nikiforov, A. Y., Yashanin, I. B.

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  3. 3
    Method for online nondestructive hardness assurance for CMOS LSI circuits realized in SOS technology

    Method for online nondestructive hardness assurance for CMOS LSI circuits realized in SOS technology by Davydov, G. G., Sogoyan, A. V., Nikiforov, A. Y., Kirgizova, A. V., Petrov, A. G., Sedakov, A. Y., Yashanin, I. B.

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  4. 4
    Xray grading procedure for conventional 65-nm CMOS technology

    Xray grading procedure for conventional 65-nm CMOS technology by Kessarinskiy, L. N., Davydov, G. G., Boychenko, D. V., Artamonov, A. S., Nikiforov, A. Y., Yashanin, I. B.

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