Search Results - Wu, Siang-Jhih Sean

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    PVT Tolerant Zero Bit-Error-Rate Physical Unclonable Function Exploiting Hot Carrier Injection Aging in 7nm FinFET Technology

    PVT Tolerant Zero Bit-Error-Rate Physical Unclonable Function Exploiting Hot Carrier Injection Aging in 7nm FinFET Technology by Velamala, Jyothi Bhaskarr, Wu, Siang-jhih Sean, Penmatsa, Padma, Shen, Kuan-Yueh James, Johnston, David, Parker, Rachael

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    A Physical Unclonable Function Leveraging Hot Carrier Injection Aging

    A Physical Unclonable Function Leveraging Hot Carrier Injection Aging by Parker, Rachael J., Velamala, Jyothi Bhaskarr A., Shen, Kuan-Yueh James, Johnston, David, Chang, Yao-Feng, Ramey, Stephen M., Wu, Siang-Jhih Sean, Penmatsa, Padma

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