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Search Results - Virmontois, C.
Search Results - Virmontois, C.
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Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose
by
Goiffon, V.
,
Estribeau, M.
,
Marcelot, O.
,
Cervantes, P.
,
Magnan, P.
,
Gaillardin, M.
,
Virmontois, C.
,
Martin-Gonthier, P.
,
Molina, R.
,
Corbiere, F.
,
Girard, S.
,
Paillet, P.
,
Marcandella, C.
Published in
IEEE transactions on nuclear science
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Evidence of a Novel Source of Random Telegraph Signal in CMOS Image Sensors
by
Goiffon, V
,
Magnan, P
,
Martin-Gonthier, P
,
Virmontois, C
,
Gaillardin, M
Published in
IEEE electron device letters
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Dark Current Random Telegraph Signals in Short-Wavelength Infrared Image Sensors Based on InGaAs
by
Virmontois, C.
,
Belloir, J.-M.
,
Pistre, L.
,
Patier, L.
,
Gilard, O.
,
Bardoux, A.
,
Goiffon, V.
,
Reverchon, J.-L.
,
Colin, T.
,
Berdin, E.
,
Saint-Pe, O.
Published in
IEEE transactions on nuclear science
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Analysis of Total Dose-Induced Dark Current in CMOS Image Sensors From Interface State and Trapped Charge Density Measurements
by
Goiffon, V
,
Virmontois, C
,
Magnan, P
,
Girard, S
,
Paillet, P
Published in
IEEE transactions on nuclear science
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Generic Radiation Hardened Photodiode Layouts for Deep Submicron CMOS Image Sensor Processes
by
Goiffon, V.
,
Cervantes, P.
,
Virmontois, C.
,
Corbiere, F.
,
Magnan, P.
,
Estribeau, M.
Published in
IEEE transactions on nuclear science
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Displacement Damage Effects in Pinned Photodiode CMOS Image Sensors
by
Virmontois, C.
,
Goiffon, V.
,
Corbiere, F.
,
Magnan, P.
,
Girard, S.
,
Bardoux, A.
Published in
IEEE transactions on nuclear science
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Displacement Damage Effects Due to Neutron and Proton Irradiations on CMOS Image Sensors Manufactured in Deep Submicron Technology
by
Virmontois, C
,
Goiffon, V
,
Magnan, P
,
Girard, S
,
Inguimbert, C
,
Petit, S
,
Rolland, G
,
Saint-Pe, O
Published in
IEEE transactions on nuclear science
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Total Ionizing Dose Versus Displacement Damage Dose Induced Dark Current Random Telegraph Signals in CMOS Image Sensors
by
Virmontois, C.
,
Goiffon, V.
,
Magnan, P.
,
Saint-Pe, O.
,
Girard, S.
,
Petit, S.
,
Rolland, G.
,
Bardoux, A.
Published in
IEEE transactions on nuclear science
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Prediction of CMOS Image Sensor Dark Current Distribution and Noise in a Space Radiation Environment
by
Martin, E.
,
Gilard, O.
,
Nuns, T.
,
David, J.
,
Virmontois, C.
Published in
IEEE transactions on nuclear science
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Proton and \gamma -Rays Irradiation-Induced Dark Current Random Telegraph Signal in a 0.18- \mu} CMOS Image Sensor
by
Martin, E.
,
Nuns, T.
,
Virmontois, C.
,
David, J.-P
,
Gilard, O.
Published in
IEEE transactions on nuclear science
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Investigation of Dark Current Random Telegraph Signal in Pinned PhotoDiode CMOS Image Sensors
by
Goiffon, V.
,
Virmontois, C.
,
Magnan, P.
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Influence of displacement damage dose on dark current distributions of irradiated CMOS image sensors
by
Virmontois, C.
,
Goiffon, V.
,
Magnan, P.
,
Girard, S.
,
Saint-Pe, O.
,
Petit, S.
,
Rolland, G.
,
Bardoux, A.
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