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Experimental determination of the oxygen K-shell fluorescence yield using thin SiO2 and Al2O3 foils
by
Hönicke, P.
,
Kolbe, M.
,
Krumrey, M.
,
Unterumsberger, R.
,
Beckhoff, B.
Published in
Spectrochimica acta. Part B: Atomic spectroscopy
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Experimental determination of the x-ray atomic fundamental parameters of nickel
by
Ménesguen, Y
,
Lépy, M-C
,
Hönicke, P
,
Müller, M
,
Unterumsberger, R
,
Beckhoff, B
,
Hoszowska, J
,
Dousse, J-Cl
,
B achucki, W
,
Ito, Y
,
Yamashita, M
,
Fukushima, S
Published in
Metrologia
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A compact and versatile grating spectrograph for soft X-ray emission analysis
by
Mantouvalou, I.
,
Staeck, S.
,
Jonas, A.
,
Grötzsch, D.
,
Spanier, M.
,
Baumann, J.
,
Witte, K.
,
Unterumsberger, R.
,
Müller, M.
,
Kanngießer, B.
Published in
Review of scientific instruments
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High accuracy experimental determination of copper and zinc mass attenuation coefficients in the 100 eV to 30 keV photon energy range
by
Ménesguen, Y
,
Gerlach, M
,
Pollakowski, B
,
Unterumsberger, R
,
Haschke, M
,
Beckhoff, B
,
Lépy, M-C
Published in
Metrologia
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Experimental determination of the oxygen K-shell fluorescence yield using thin SiO 2 and Al 2 O 3 foils
by
Hönicke, P.
,
Kolbe, M.
,
Krumrey, M.
,
Unterumsberger, R.
,
Beckhoff, B.
Published in
Spectrochimica acta. Part B: Atomic spectroscopy
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Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se2 absorber films
by
Streeck, C.
,
Brunken, S.
,
Gerlach, M.
,
Herzog, C.
,
Hönicke, P.
,
Kaufmann, C. A.
,
Lubeck, J.
,
Pollakowski, B.
,
Unterumsberger, R.
,
Weber, A.
,
Beckhoff, B.
,
Kanngießer, B.
,
Schock, H.-W.
,
Mainz, R.
Published in
Applied physics letters
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Focusing of soft X-ray radiation and characterization of the beam profile enabling X-ray emission spectrometry at nanolayered specimens
by
Unterumsberger, R.
,
Müller, M.
,
Beckhoff, B.
,
Hönicke, P.
,
Pollakowski, B.
,
Bjeoumikhova, S.
Published in
Spectrochimica acta. Part B: Atomic spectroscopy
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Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se{sub 2} absorber films
by
Streeck, C.
,
Physikalisch-Technische Bundesanstalt, Abbestr.2-12, 10587 Berlin
,
Brunken, S.
,
Kaufmann, C. A.
,
Weber, A.
,
Schock, H.-W.
,
Mainz, R.
,
Gerlach, M.
,
Hönicke, P.
,
Lubeck, J.
,
Pollakowski, B.
,
Unterumsberger, R.
,
Beckhoff, B.
,
Herzog, C.
,
Kanngießer, B.
Published in
Applied physics letters
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