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1by Naresh-Kumar, G, Vilalta-Clemente, A, Jussila, H, Winkelmann, A, Nolze, G, Vespucci, S, Nagarajan, S, Wilkinson, A J, Trager-Cowan, CGet full text
Published in Scientific reports
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6by Walde, S., Hagedorn, S., Coulon, P.-M., Mogilatenko, A., Netzel, C., Weinrich, J., Susilo, N., Ziffer, E., Matiwe, L., Hartmann, C., Kusch, G., Alasmari, A., Naresh-Kumar, G., Trager-Cowan, C., Wernicke, T., Straubinger, T., Bickermann, M., Martin, R.W., Shields, P.A., Kneissl, M., Weyers, M.Get full text
Published in Journal of crystal growth
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9by Zhao, X., Huang, K., Bruckbauer, J., Shen, S., Zhu, C., Fletcher, P., Feng, P., Cai, Y., Bai, J., Trager-Cowan, C., Martin, R. W., Wang, T.Get full text
Published in Scientific reports
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12by Naresh-Kumar, G., Vilalta-Clemente, A., Pandey, S., Skuridina, D., Behmenburg, H., Gamarra, P., Patriarche, G., Vickridge, I., di Forte-Poisson, M. A., Vogt, P., Kneissl, M., Morales, M., Ruterana, P., Cavallini, A., Cavalcoli, D., Giesen, C., Heuken, M., Trager-Cowan, C.Get full text
Published in AIP advances
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13by Naresh-Kumar, G., Alasmari, A., Kusch, G., Edwards, P.R., Martin, R.W., Mingard, K.P., Trager-Cowan, C.Get full text
Published in Ultramicroscopy
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14by Le Boulbar, E.D., Priesol, J., Nouf-Allehiani, M., Naresh-Kumar, G., Fox, S., Trager-Cowan, C., Šatka, A., Allsopp, D.W.E., Shields, P.A.Get full text
Published in Journal of crystal growth
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16by Trager-Cowan, C, Alasmari, A, Avis, W, Bruckbauer, J, Edwards, P R, Ferenczi, G, Hourahine, B, Kotzai, A, Kraeusel, S, Kusch, G, Martin, R W, McDermott, R, Naresh-Kumar, G, Nouf-Allehiani, M, Pascal, E, Thomson, D, Vespucci, S, Smith, M D, Parbrook, P J, Enslin, J, Mehnke, F, Kuhn, C, Wernicke, T, Kneissl, M, Hagedorn, S, Knauer, A, Walde, S, Weyers, M, Coulon, P-M, Shields, P A, Bai, J, Gong, Y, Jiu, L, Zhang, Y, Smith, R M, Wang, T, Winkelmann, AGet full text
Published in Semiconductor science and technology
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19by Trager-Cowan, C, Alasmari, A, Avis, W, Bruckbauer, J, Edwards, P R, Hourahine, B, Kraeusel, S, Kusch, G, Jablon, B M, Johnston, R, Martin, R W, Mcdermott, R, Naresh-Kumar, G, Nouf-Allehiani, M, Pascal, E, Thomson, D, Vespucci, S, Mingard, K, Parbrook, P J, Smith, M D, Enslin, J, Mehnke, F, Kneissl, M, Kuhn, C, Wernicke, T, Knauer, A, Hagedorn, S, Walde, S, Weyers, M, Coulon, P-M, Shields, P A, Zhang, Y, Jiu, L, Gong, Y, Smith, R M, Wang, T, Winkelmann, AGet full text
Published in IOP conference series. Materials Science and Engineering
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20by Trager-Cowan, C., Naresh-Kumar, G., Allehiani, N., Kraeusel, S., Hourahine, B., Vespucci, S., Thomson, D., Bruckbauer, J., Kusch, G., Edwards, P. R., Martin, R. W., Mauder, C., Day, A. P., Winkelmann, A., Vilalta-Clemente, A., Wilkinson, A. J., Parbrook, P. J., Kappers, M. J., Moram, M. A., Oliver, R. A., Humphreys, C. J., Shields, P., Le Boulbar, E. D., Maneuski, D., O'Shea, V., Mingard, K. P.Get full text
Published in Microscopy and microanalysis
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