Search Results - Thoka, W

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  1. 1
    Supplementary comparison of the measurement of the alpha and beta particle surface emission rates from large area sources (CCRI(II)-S10 LASCE)

    Supplementary comparison of the measurement of the alpha and beta particle surface emission rates from large area sources (CCRI(II)-S10 LASCE) by Felice, P De, Anuradha, R, Bludovsky, J, Bobin, C, Bosley, R, Broda, R, Capogni, M, Collins, S M, Dix, T, Frechou, C, Hutchins, S, Ioan, R, Javornik, A, Joseph, L, Keightley, J D, Kharitonov, I A, King, L, Kulkami, D B, Lewis, G, Arcos, J M Los, Maringer, F J, Mihelic, M, Msimang, Z, Nahle, O, Netwon, S, Pateman, D, Sahagia, M, Sato, Y, Slade, J, Sokolova, I A, Sparrow, R, Stanev, S, Stanga, D, Svec, A, Szucs, L, Thoka, W, Unterweger, M, Woods, M J, Yamada, T, Yamamoto, S, Yunoki, A, Zanevsky, A, Zhao, Q, Ziemek, T

    Published in Metrologia
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  2. 2
    Microstructure and electronic properties of ultra-nano-crystalline-diamond thin films

    Microstructure and electronic properties of ultra-nano-crystalline-diamond thin films by Thoka, R.W., Moloi, S.J., Ray, Sekhar C., Pong, W.F., Lin, I.-N.

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