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6by Tessier, Christine, Suhard, David, Rebière, François, Souidi, Maâmar, Dublineau, Isabelle, Agarande, MichelleGet full text
Published in Microscopy and microanalysis
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Published in Journal of hazardous materials
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18by Demuynck, Steven, Huffman, Craig, Claes, Martine, Suhard, Samuel, Versluijs, Janko, Volders, Henny, Heylen, Nancy, Kellens, Kristof, Croes, Kristof, Struyf, Herbert, Vereecke, Guy, Verdonck, Patrick, Roest, David De, Beynet, Julien, Sprey, Hessel, Beyer, Gerald P.Get full text
Published in Japanese Journal of Applied Physics
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19by Demuynck, Steven, Huffman, Craig, Claes, Martine, Suhard, Samuel, Versluijs, Janko, Volders, Henny, Heylen, Nancy, Kellens, Kristof, Croes, Kristof, Struyf, Herbert, Vereecke, Guy, Verdonck, Patrick, De Roest, David, Beynet, Julien, Sprey, Hessel, Beyer, Gerald PGet full text
Published in Jpn J Appl Phys
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