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One-Dimensional Thickness Scaling Study of Phase Change Material (\hbox\hbox\hbox) Using a Pseudo 3-Terminal Device
by
SangBum Kim
,
Byoung-Jae Bae
,
Yuan Zhang
,
Jeyasingh, R G D
,
Youngkuk Kim
,
In-Gyu Baek
,
Soonoh Park
,
Seok-Woo Nam
,
Wong, H.-S P
Published in
IEEE transactions on electron devices
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Microstructural Characterization in Reliability Measurement of Phase Change Random Access Memory
by
Bae, Junsoo
,
Hwang, Kyuman
,
Park, Kwangho
,
Jeon, Seongbu
,
Kang, Dae-hwan
,
Park, Soonoh
,
Ahn, Juhyeon
,
Kim, Seoksik
,
Jeong, Gitae
,
Chung, Chilhee
Published in
Japanese Journal of Applied Physics
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Microstructural Characterization in Reliability Measurement of Phase Change Random Access Memory
by
Bae, Junsoo
,
Hwang, Kyuman
,
Park, Kwangho
,
Jeon, Seongbu
,
Kang, Dae-hwan
,
Park, Soonoh
,
Ahn, Juhyeon
,
Kim, Seoksik
,
Jeong, Gitae
,
Chung, Chilhee
Published in
Japanese Journal of Applied Physics
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1D thickness scaling study of phase change material (Ge2Sb2Te5) using a pseudo 3-terminal device
by
Byoung-Jae Bae
,
SangBum Kim
,
Yuan Zhang
,
Youngkuk Kim
,
In-Gyu Baek
,
Soonoh Park
,
In-Seok Yeo
,
Siyoung Choi
,
Joo-Tae Moon
,
Wong, H.-S.P.
,
Kinam Kim
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A novel Ir/IrO/sub 2//Pt-PZT-Pt/IrO/sub 2//Ir capacitor for a highly reliable mega-scale FRAM
by
Dongjin Jung
,
Hyunho Kim
,
Yoonjong Song
,
Nakwon Jang
,
Bonjae Koo
,
Sungyung Lee
,
Soonoh Park
,
Yungwook Park
,
Kinam Kim
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Conference Proceeding
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