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Search Results - Siddabathula, M.
Search Results - Siddabathula, M.
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Excellent Reliability performances of a truly 5V nBOXFET for Automotive and IOT applications
by
Lipp, D.
,
Zhao, Z.
,
Krause, G.
,
Arfaoui, W.
,
Ebrard, E.
,
Bossu, G.
,
Evseev, S.
,
Herklotz, M.
,
Siddabathula, M.
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Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area
by
Toledano-Luque, M.
,
Paliwoda, P.
,
Nour, M.
,
Kauerauf, T.
,
Min, B.
,
Bossu, G.
,
Siddabathula, M.
,
Nigam, T.
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A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology
by
Arfaoui, W.
,
Bossu, G.
,
Muhlhoff, A.
,
Lipp, D.
,
Manuwald, R.
,
Chen, T.
,
Nigam, T.
,
Siddabathula, M.
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22FDX™ 5G 28GHz 20dBm Power Amplifier Constant Load and VSWR accelerated aging reliability
by
Bossu, G.
,
Syed, S.
,
Evseev, S.
,
Jerome, J.A.S.
,
Arfaoui, W.
,
Lipp, D.
,
Siddabathula, M.
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A Deeper Understanding of Well Charging Reliability with Circuit Relevant Test Structures
by
Tan, T. L.
,
Eng, C. W.
,
Xu, H.
,
Soon, J. M.
,
Ebard, E.
,
Siddabathula, M.
,
Phoong, B. F.
,
Poh, K. H.
,
Prabhu, M.
,
Zhao, X. -L.
,
Koo, J. M.
,
Cho, K.
,
Zhang, G.-W.
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Experimental reliability study of cumulative damage models on state-of-the-art semiconductor technologies for step-stress tests and mission profile stresses
by
Hirler, A.
,
Biba, J.
,
Lipp, D.
,
Lochner, H.
,
Siddabathula, M.
,
Simon, S.
,
Sulima, T.
,
Wiatr, M.
,
Hansch, W.
Published in
Journal of vacuum science and technology. B, Nanotechnology & microelectronics
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Excellent 22FDX Hot-Carrier Reliability for PA Applications
by
Chen, T.
,
Zhang, C.
,
Arfaoui, W.
,
Bellaouar, A.
,
Embabi, S.
,
Bossu, G.
,
Siddabathula, M.
,
Chew, K.W.J.
,
Ong, S. N.
,
Mantravadi, M.
,
Barnett, K.
,
Bordelon, J.
,
Taylor, R.
,
Janardhanan, S.
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