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A 1-Tb, 4b/Cell, 176-Stacked-WL 3D-NAND Flash Memory with Improved Read Latency and a 14.8Gb/mm2 Density
by
Cho, Wanik
,
Jung, Jongseok
,
Kim, Jongwoo
,
Ham, Junghoon
,
Lee, Sangkyu
,
Noh, Yujong
,
Kim, Dauni
,
Lee, Wanseob
,
Cho, Kayoung
,
Kim, Kwanho
,
Lee, Heejoo
,
Chai, Sooyeol
,
Jo, Eunwoo
,
Cho, Hanna
,
Kim, Jong-Seok
,
Kwon, Chankeun
,
Park, Cheolioona
,
Nam, Hveonsu
,
Won, Haeun
,
Kim, Taeho
,
Park, Kyeonghwan
,
Oh, Sanghoon
,
Ban, Jinhyun
,
Park, Junyoung
,
Shin, Jaehyeon
,
Shin, Taisik
,
Jang, Junseo
,
Mun, Jiseong
,
Choi, Jehyun
,
Choi, Hyunseung
,
Choi, Suna-Wook
,
Park, Wonsun
,
Yoon, Dongkvu
,
Kim, Minsu
,
Lim, Junvoun
,
An, Chiwook
,
Shirr, Hyunyoung
,
Oh, Haesoon
,
Park, Haechan
,
Shim, Sungbo
,
Huh, Hwang
,
Choi, Honasok
,
Lee, Seungpil
,
Sim, Jaesuna
,
Gwon, Kichana
,
Kim, Jumsoo
,
Jeong, Woopyo
,
Choi, Jungdal
,
Jin, Kyo-Won
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19.2 A 93.4mm2 64Gb MLC NAND-flash memory with 16nm CMOS technology
by
Sungdae Choi
,
Duckju Kim
,
Sungwook Choi
,
Byungryul Kim
,
Sunghyun Jung
,
Kichang Chun
,
Namkyeong Kim
,
Wanseob Lee
,
Taisik Shin
,
Hyunjong Jin
,
Hyunchul Cho
,
Sunghoon Ahn
,
Yonghwan Hong
,
Ingon Yang
,
Byoungyoung Kim
,
Pilseon Yoo
,
Youngdon Jung
,
Jinwoo Lee
,
Jaehyeon Shin
,
Taeyun Kim
,
Kunwoo Park
,
Jinwoong Kim
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Conference Proceeding
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Flash Memories
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Computer Architecture
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Conferences
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Cost Effectiveness
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Costs
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Couplings
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Density
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Error Correction Codes
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Flash Memory
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Integrated Circuit Interconnections
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Microprocessors
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Noise
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Nonvolatile Memory
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Reliability
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Sensors
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Threshold Voltage
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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