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8by Meyers, V., Rocco, E., Anderson, T. J., Gallagher, J. C., Ebrish, M. A., Jones, K., Derenge, M., Shevelev, M., Sklyar, V., Hogan, K., McEwen, B., Shahedipour-Sandvik, F.Get full text
Published in Journal of applied physics
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