Search Results - Ruano, S.M.F.

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    Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum

    Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum by Minkov, D.A., Gavrilov, G.M., Angelov, G.V., Moreno, J.M.D., Vazquez, C.G., Ruano, S.M.F., Marquez, E.

    Published in Thin solid films
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