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Search Results - Rosenits, Philipp
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Determining the defect parameters of the deep aluminum-related defect center in silicon
by
Rosenits, Philipp
,
Roth, Thomas
,
Glunz, Stefan W.
,
Beljakowa, Svetlana
Published in
Applied physics letters
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Epitaxially grown crystalline silicon thin-film solar cells reaching 16.5% efficiency with basic cell process
by
Rosenits, Philipp
,
Kopp, Fabian
,
Reber, Stefan
Published in
Thin solid films
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Determination of the minority carrier lifetime in crystalline silicon thin-film material
by
Walter, Dominic
,
Rosenits, Philipp
,
Berger, Bastian
,
Reber, Stefan
,
Warta, Wilhelm
Published in
Progress in photovoltaics
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Erratum on "Determining the defect parameters of the deep aluminum-related defect center in silicon" [Appl. Phys. Lett. 91, 122109 (2007)]
by
Rosenits, Philipp
,
Roth, Thomas
,
Glunz, Stefan W.
Published in
Applied physics letters
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Determination of the minority carrier lifetime in crystalline silicon thin-film material: Determination of the minority carrier lifetime in cSiTF material
by
Walter, Dominic
,
Rosenits, Philipp
,
Berger, Bastian
,
Reber, Stefan
,
Warta, Wilhelm
Published in
Progress in photovoltaics
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Evaluation of the influence of an embedded porous silicon layer on the bulk lifetime of epitaxial layers and the interface recombination at the epitaxial layer/porous silicon inter...
by
Radhakrishnan, Hariharsudan Sivaramakrishnan
,
Dross, Frederic
,
Debucquoy, Maarten
,
Rosenits, Philipp
,
Van Nieuwenhuysen, Kris
,
Gordon, Ivan
,
Poortmans, Jef
,
Mertens, Robert
Published in
Progress in photovoltaics
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Influence of different excitation spectra on the measured carrier lifetimes in quasi-steady-state photoconductance measurements
by
Rosenits, Philipp
,
Roth, Thomas
,
Warta, Wilhelm
,
Glunz, Stefan W.
Published in
Solar energy materials and solar cells
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Determining the excess carrier lifetime in crystalline silicon thin-films by photoluminescence measurements
by
Rosenits, Philipp
,
Roth, Thomas
,
Warta, Wilhelm
,
Reber, Stefan
,
Glunz, Stefan W.
Published in
Journal of applied physics
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Comparison of photoconductance- and photo-luminescence-based lifetime measurement techniques
by
Roth, T.
,
Rosenits, P.
,
Rudiger, M.
,
Warta, W.
,
Glunz, S.W.
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