Showing
1 - 9
results of
9
Skip to content
VuFind
Log in
Library Catalogue Plus
Library
Subject guides
Databases
Referencing
Catalogue
Articles Plus
Keyword
Title
Author
Subject
Find
Advanced Search
Search Results - Rahim, Nilufa
Search Results - Rahim, Nilufa
Showing
1 - 9
results of
9
Refine Results
Sort
Relevance
Date Descending
Author
Title
1
Loading…
Correlation of Negative Bias Temperature Instability and Breakdown in HfO 2 /TiN Gate Stacks
by
Rahim, Nilufa
,
Misra, D.
Published in
ECS transactions
Get full text
Items that cite this one
Article
Save to List
Saved in:
2
Loading…
Low Voltage SILC Analysis for High-k/metal Gate Dielectrics
by
Rahim, Nilufa
,
Misra, D.
Get full text
Conference Proceeding
Save to List
Saved in:
3
Loading…
Breakdown Characteristics of High-k Gate Dielectrics with Metal Gates
by
Rahim, Nilufa
,
Misra, D.
Get full text
Items that cite this one
Conference Proceeding
Save to List
Saved in:
4
Loading…
Investigation of progressive breakdown and non-Weibull failure distribution of high-k and SiO2 dielectric by ramp voltage stress
by
Rahim, Nilufa
,
Wu, Ernest Y
,
Misra, Durgamadhab
Request full text
Conference Proceeding
Save to List
Saved in:
5
Loading…
Deposited ALD SiO2 High-k/Metal Gate Interface for High Voltage Analog and I/O Devices on Next Generation Alternative Channels and FINFET Device Structures
by
Siddiqui, Shahab
,
Chowdhury, Murshed M
,
Brodsky, Maryjane
,
Rahim, Nilufa
,
Dai, Min
,
Krishnan, Siddarth
,
Fugardi, Steve
,
Wu, Ernest
,
Chou, Anthony
,
Narasimha, Shreesh
,
Li, Jinghong
,
Mcstay, Kevin
,
Linder, Barry
,
Maciejewski, Edward
,
Rettmann, Ryan
,
Mittl, Steven
,
Kwon, Unoh
,
Narayanan, Vijay
,
Henson, William
,
Schepis, Dominic
,
Chudzik, Michael
Get full text
Conference Proceeding
Save to List
Saved in:
6
Loading…
Deposited ALD SiO 2 High-k/Metal Gate Interface for High Voltage Analog and I/O Devices on Next Generation Alternative Channels and FINFET Device Structures
by
Siddiqui, Shahab
,
Chowdhury, Murshed M
,
Brodsky, Maryjane
,
Rahim, Nilufa
,
Dai, Min
,
Krishnan, Siddarth
,
Fugardi, Steve
,
Wu, Ernest
,
Chou, Anthony
,
Narasimha, Shreesh
,
Li, Jinghong
,
Mcstay, Kevin
,
Linder, Barry
,
Maciejewski, Edward
,
Rettmann, Ryan
,
Mittl, Steven
,
Kwon, Unoh
,
Narayanan, Vijay
,
Henson, William
,
Schepis, Dominic
,
Chudzik, Michael
Published in
ECS transactions
Get full text
Items that cite this one
Article
Save to List
Saved in:
7
Loading…
Role of Bulk HfO2 and Interfacial SiO2 Layer in Breakdown Characteristics of TiN/HfO2/SiO2/Si Gate Stacks
by
Rahim, Nilufa
,
Chowdhury, Naser
,
Misra, D.
Get full text
Items that cite this one
Conference Proceeding
Save to List
Saved in:
8
Loading…
Reliability characterization of 32nm high-k metal gate SOI technology with embedded DRAM
by
Mittl, S.
,
Swift, A.
,
Wu, E.
,
Ioannou, D.
,
Fen Chen
,
Massey, G.
,
Rahim, N.
,
Hauser, M.
,
Hyde, P.
,
Lukaitis, J.
,
Rauch, S.
,
Saroop, S.
,
Yanfeng Wang
Request full text
Conference Proceeding
Save to List
Saved in:
9
Loading…
Temperature Effects on Breakdown Characteristics of High- \kappa Gate Dielectrics With Metal Gates
by
Rahim, N.
,
Misra, D.
Published in
IEEE transactions on device and materials reliability
Get full text
Items that this one cites
Items that cite this one
Magazinearticle
Save to List
Saved in:
Search Tools:
RSS Feed
Email Search
Save Search
Back
Refine Results
Page will reload when a filter is selected or excluded.
Limit To
Peer Reviewed
1 results
1
Full Text
9 results
9
Format
Conference Proceedings
6 results
6
Articles
2 results
2
Magazine Articles
1 results
1
Journal Title
Ecs Transactions
2 results
2
Ieee Transactions On Device And Materials Reliability
1 results
1
Subjects
Physical Sciences
3 results
3
Physics
3 results
3
Science & Technology
3 results
3
Stress
3 results
3
Technology
3 results
3
Dielectrics
2 results
2
Electric Breakdown
2 results
2
Electrochemistry
2 results
2
Engineering
2 results
2
Engineering, Electrical & Electronic
2 results
2
Logic Gates
2 results
2
Materials Science
2 results
2
Physics, Applied
2 results
2
Acceleration
1 results
1
Breakdown Voltage
1 results
1
Bti
1 results
1
Cvs
1 results
1
Data Mining
1 results
1
Dielectric Breakdown
1 results
1
Dielectric Substrates
1 results
1
Year of Publication
From:
To:
Source
Institute Of Physics
6 results
6
Iopscience Journals
6 results
6
Ieee Electronic Library (Iel) Conference Proceedings
2 results
2
Ieee Xplore All Conference Series
2 results
2
Science Citation Index Expanded (Web Of Science)
1 results
1
Ieee Electronic Library (Iel) Journals
1 results
1
Ieee Xplore All Journals
1 results
1