The Effects of Carbon Doping on the Performance and Electrical Reliability of SiGe HBTs by Lee, Harrison P., Sepulveda-Ramos, Nelson E., Teng, Jeffrey W., Moody, Jackson P., Nergui, Delgermaa, Ringel, Brett L., Brumbach, Zachary R., Premani, Alizeh, Raghunathan, Uppili S., Jain, Vibhor, Cressler, John D.

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