Search Results - Podorozhniy, O. V.

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  1. 1
    Simulation of Material Sputtering and Gallium Implantation during Focused Ion Beam Irradiation of a Silicon Substrate

    Simulation of Material Sputtering and Gallium Implantation during Focused Ion Beam Irradiation of a Silicon Substrate by Podorozhniy, O. V., Rumyantsev, A. V., Volkov, R. L., Borgardt, N. I.

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  2. 2
    Simulation of Silicon Carbide Sputtering by a Focused Gallium Ion Beam

    Simulation of Silicon Carbide Sputtering by a Focused Gallium Ion Beam by Rumyantsev, A. V., Podorozhniy, O. V., Volkov, R. L., Borgardt, N. I.

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    Blochemical monitoring of genetic collections of strawberry in NCFSCHVW and CEBS

    Blochemical monitoring of genetic collections of strawberry in NCFSCHVW and CEBS by Prichko, T.G., Germanova, M.G., Podorozhniy, V.N.

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