Search Results - Pisecny, Pavol

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    Properties of the Si-SiO2 Interfaces in MOS Structures with Nitrogen Doped Silicon

    Properties of the Si-SiO2 Interfaces in MOS Structures with Nitrogen Doped Silicon by Harmatha, Ladislav, Ballo, Peter, Breza, Juraj, Pisecny, Pavol, Tapajna, Milan

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    Characterization of High Energy Irradiated MOS Structures Using the Capacitance Methods

    Characterization of High Energy Irradiated MOS Structures Using the Capacitance Methods by Pisecny, Pavol, Stuchlikova, Lubica, Harmatha, Ladislav, Tapajna, Milan, Csabay, Otto

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    Characterization of Unipolar Power Devices Technology

    Characterization of Unipolar Power Devices Technology by Harmatha, Ladislav, Tapajna, Milan, Pisecny, Pavol, Stuchlikova, Lubica, Donoval, Daniel

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