Search Results - Parrill, Thomas M.

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    Characterization of the α-Sn/CdTe(110) interface by angle-resolved X-ray photoemission

    Characterization of the α-Sn/CdTe(110) interface by angle-resolved X-ray photoemission by Lin, Tzer-Shen, Partin, William J., Damminga, Gregg M., Parrill, Thomas M., Lee, Won-Jong, Chung, Yip-Wah

    Published in Surface science
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    Predictive process simulation of cryogenic implants for leading edge transistor design

    Predictive process simulation of cryogenic implants for leading edge transistor design by Gossmann, Hans-Joachim, Zographos, Nikolas, Park, Hugh, Colombeau, Benjamin, Parrill, Thomas, Khasgiwale, Niranjan, Borges, Ricardo, Gull, Ronald, Erokhin, Yuri, Synopsys Switzerland LLC, Thurgauerstrasse 40, 8050 Zuerich, Applied Materials, Inc., Varian Semiconductor Equipment Business Unit, 35 Dory Road, Gloucester, MA 01930, Synopsys Inc., 1101 Slater Road, Durham, NC 27703, Applied Materials, Inc., Varian Semiconductor Equipment Business Unit, 35 Dory Road, Gloucester, MA 01930

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