Search Results - Pérez-Olguín, Iván J. C.

  • Showing 1 - 3 results of 3
Refine Results
  1. 1
    Reliability Analysis Based on a Gamma-Gaussian Deconvolution Degradation Modeling with Measurement Error

    Reliability Analysis Based on a Gamma-Gaussian Deconvolution Degradation Modeling with Measurement Error by Rodríguez-Picón, Luis Alberto, Méndez-González, Luis Carlos, Romero-López, Roberto, Pérez-Olguín, Iván J. C., Rodríguez-Borbón, Manuel Iván, Valles-Rosales, Delia Julieta

    Published in Applied sciences
    Get full text
    Items that this one cites
    Article
    Save to List
    Saved in:
  2. 2
    Degradation modeling based on the gamma process with random initial degradation level and random threshold

    Degradation modeling based on the gamma process with random initial degradation level and random threshold by Rodríguez-Picón, Luis Alberto, Méndez-González, Luis Carlos, Flores-Ochoa, Víctor Hugo, Pérez Olguín, Iván JC, García, Vicente

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  3. 3
    A Deconvolution Approach for Degradation Modeling With Measurement Error

    A Deconvolution Approach for Degradation Modeling With Measurement Error by Rodriguez-Picon, Luis Alberto, Perez-Dominguez, Luis, Mejia, Jose, Perez-Olguin, Ivan Jc, Rodriguez-Borbon, Manuel I.

    Published in IEEE access
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:

Search Tools: