IBM experiments in soft fails in computer electronics (1978-1994) by ZIEGLER, J. F, CURTIS, H. W, LAFAVE, L. E, WALSH, J. L, ORRO, J.M, UNGER, G. J, ROSS, J. M, O'GORMAN, T. J, MESSINA, B, SULLIVAN, T. D, SYKES, A. J, YOURKE, H, MUHLFELD, H. P, ENGER, T. A, TOLAT, V, SCOTT, T. S, TABER, A. H, SUSSMAN, R. J, KLEIN, W. A, WAHAUS, C. W, MONTROSE, C. J, CHIN, B, NICEWICZ, M, RUSSELL, C. A, WANG, W. Y, FREEMAN, L. B, HOSIER, P

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