Search Results - Nobre, F.V.J

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    A multi-defect initialization-based percolation model: a successful scheme to explain dielectric breakdown in MOS devices

    A multi-defect initialization-based percolation model: a successful scheme to explain dielectric breakdown in MOS devices by dos Santos, R.P, Nobre, F.V.J, Costa, U.M.S, Freire, V.N, Lyra, M.L, da Silva, E.F

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