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Search Results - Murfitt, M.F.
Search Results - Murfitt, M.F.
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Improvements in the X-Ray Analytical Capabilities of a Scanning Transmission Electron Microscope by Spherical-Aberration Correction
by
Watanabe, M.
,
Ackland, D.W.
,
Burrows, A.
,
Kiely, C.J.
,
Williams, D.B.
,
Krivanek, O.L.
,
Dellby, N.
,
Murfitt, M.F.
,
Szilagyi, Z.
Published in
Microscopy and microanalysis
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Direct Sub-Angstrom Imaging of a Crystal Lattice
by
Nellist, P. D.
,
Chisholm, M. F.
,
Dellby, N.
,
Krivanek, O. L.
,
Murfitt, M. F.
,
Szilagyi, Z. S.
,
Lupini, A. R.
,
Borisevich, A.
,
Sides, W. H.
,
Pennycook, S. J.
Published in
Science (American Association for the Advancement of Science)
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An electron microscope for the aberration-corrected era
by
Krivanek, O.L.
,
Corbin, G.J.
,
Dellby, N.
,
Elston, B.F.
,
Keyse, R.J.
,
Murfitt, M.F.
,
Own, C.S.
,
Szilagyi, Z.S.
,
Woodruff, J.W.
Published in
Ultramicroscopy
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Towards sub-0.5 Å electron beams
by
Krivanek, O.L.
,
Nellist, P.D.
,
Dellby, N.
,
Murfitt, M.F.
,
Szilagyi, Z.
Published in
Ultramicroscopy
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Open-Source Python Scripting and Analysis with Nion Swift
by
Murfitt, M.F.
,
Meyer, C.E.
,
Skone, G.
,
Dellby, N.
,
Krivanek, O.L.
Published in
Microscopy and microanalysis
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Improving the Spatial Resolution of Low-keV STEM with a Monochromator
by
Lovejoy, T.C.
,
Dellby, N.
,
Corbin, G.J.
,
Hrncirik, P.
,
Murfitt, M.F.
,
Szilagyi, Z.S.
,
Krivanek, O.L.
Published in
Microscopy and microanalysis
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Monochromated STEM with high energy and spatial resolutions
by
Krivanek, O.L.
,
Lovejoy, T.C.
,
Corbin, G.J.
,
Dellby, N.
,
Murfitt, M.F.
,
Kurz, N.
,
Batson, P.E.
,
Carpenter, R.W.
Published in
Microscopy and microanalysis
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High Energy Resolution Monochromated EELS-STEM System
by
Krivanek, O.L.
,
Lovejoy, T.C.
,
Bacon, N.J.
,
Corbin, G.J.
,
Dellby, N.
,
Hrncirik, P.
,
Murfitt, M.F.
,
Skone, G.
,
Szilagyi, Z.S.
,
Batson, P.E.
,
Carpenter, R.W.
Published in
Microscopy and microanalysis
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Exploring new frontiers with the Nion aberration-corrected STEM
by
Bacon, N.J.
,
Corbin, G.J.
,
Dellby, N.
,
Hrncirik, P.
,
Kurz, N.
,
Lovejoy, T.C.
,
Murfitt, M.F.
,
Skone, G.S.
,
Szilagyi, Z.S.
,
Krivanek, O.L.
Published in
Microscopy and microanalysis
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Optimized Quadrupole-Octupole C3/C5 Aberration Corrector for STEM
by
Dellby, N.
,
Krivanek, O.L
,
Murfitt, M.F.
Published in
Physics procedia
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Towards sub-0.5Å electron beams
by
Krivanek, O.L.
,
Nellist, P.D.
,
Dellby, N.
,
Murfitt, M.F.
,
Szilagyi, Z.
Published in
Ultramicroscopy
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