Search Results - Mukundhan, P
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Controlling TC SAW Filter Frequency with Picosecond Ultrasonics
Conference Proceeding -
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Non-destructive acoustic metrology and void detection in 3×50μm TSV
Conference Proceeding -
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In-Die vs. Scribe-Line Copper CMP Monitoring
Published in Semiconductor InternationalGet full text
Magazinearticle -
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Optoelectronic thin-film characterization
Published in Semiconductor InternationalGet full text
Magazinearticle