Search Results - Mebonia, Mikheil

  • Showing 1 - 1 results of 1
Refine Results
  1. 1
    Characterisation of engineered defects in extreme ultraviolet mirror substrates using lab-scale extreme ultraviolet reflection ptychography

    Characterisation of engineered defects in extreme ultraviolet mirror substrates using lab-scale extreme ultraviolet reflection ptychography by Lu, Haoyan, Odstrčil, Michal, Pooley, Charles, Biller, Jan, Mebonia, Mikheil, He, Guanze, Praeger, Matthew, Juschkin, Larissa, Frey, Jeremy, Brocklesby, William

    Published in Ultramicroscopy
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:

Search Tools: