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Mason, John W.
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Mason, John W.
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1
Determining an appropriate number of FOUPs in semiconductor wafer fabrication facilities
by
Zimmermann, Jens
,
Mason, Scott J.
,
Fowler, John W.
,
Monch, Lars
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2
High performance ladar focal plane arrays for 3D range imaging
by
Vaidyanathan, M.
,
Joshi, A.
,
Song Xue
,
Hanyaloglu, B.
,
Thomas, M.
,
Zandian, M.
,
Edwall, D.
,
Williams, G.
,
Blackwell, J.
,
Tennant, W.
,
Hughes, G.
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3
A large scale footstep database for biometric studies created using cross-biometrics for labelling
by
Vera-Rodriguez, R.
,
Lewis, R.P.
,
Mason, J.S.D.
,
Evans, N.W.D.
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4
Multi-Objective Semiconductor Manufacturing Scheduling: A Random Keys Implementation of NSGA-II
by
Mason, S.J.
,
Kurz, M.E.
,
Pfund, M.E.
,
Fowler, J.W.
,
Pohl, L.M.
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5
Innovation and Change as Competitive Tools in Manufacturing Operations
by
Mason, J.J.
,
Jablokow, K.W.
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6
On the fundamental limitations of spectral subtraction: An assessment by automatic speech recognition
by
Evans, Nicholas W. D.
,
Mason, John S.
,
Liu, Wei M.
,
Fauve, Benoit
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7
Maximizing delivery performance in semiconductor wafer fabrication facilities
by
Mason, S.J.
,
Fowler, J.W.
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8
An experimental study on the feasibility of footsteps as a biometric
by
Rodriguez, Ruben Vera
,
Evans, Nicholas W. D.
,
Lewis, Richard P.
,
Fauve, Benoit
,
Mason, John S. D.
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9
A comparison study of the logic of four wafer fabrication simulators
by
Mason, Scott
,
Jensen, Paul
,
Fowler, John
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Technology
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Science & Technology
5
Computer Science
4
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4
Engineering, Electrical & Electronic
3
Job Shop Scheduling
3
Mathematics
3
Processor Scheduling
2
Support Vector Machines
2
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2
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2
Physical Sciences
2
Industrial Engineering
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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