Search Results - Markwort, Lars

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  1. 1
    Microelectrode substrates — a solution to current problems in surface-enhanced Raman spectroscopy (SERS)

    Microelectrode substrates — a solution to current problems in surface-enhanced Raman spectroscopy (SERS) by Markwort, Lars, Hendra, Patrick

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  2. 2
    Determination of free melamine content in melamine-formaldehyde resins by Raman spectroscopy

    Determination of free melamine content in melamine-formaldehyde resins by Raman spectroscopy by Scheepers, Martine L., Meier, Robert J., Markwort, Lars, Gelan, J.M., Vanderzande, D.J., Kip, Bert J.

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    Pre- and post-thinning silicon thickness mapping using a high throughput defect inspection system for advanced 3D IC packaging

    Pre- and post-thinning silicon thickness mapping using a high throughput defect inspection system for advanced 3D IC packaging by Guittet, Pierre-Yves, Shivaprasad, Deepak, Markwort, Lars, Savage, Greg, Kappel, Christoph, Vartaman, Victor H.

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  4. 4
    Metrology and inspection for process control during bonding and thinning of stacked wafers for manufacturing 3D SIC's

    Metrology and inspection for process control during bonding and thinning of stacked wafers for manufacturing 3D SIC's by Halder, S., Jourdain, A., Claes, M., de Wolf, I., Travaly, Y., Beyne, E., Swinnen, B., Pepper, V., Guittet, P-Y, Savage, G., Markwort, L.

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