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Markus, Stanislav
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Search Results - Markus, Stanislav
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Markus, Stanislav
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Predictive Hot-Carrier Modeling of n-Channel MOSFETs
by
Bina, Markus
,
Tyaginov, Stanislav
,
Franco, Jacopo
,
Rupp, Karl
,
Wimmer, Yannick
,
Osintsev, Dmitry
,
Kaczer, Ben
,
Grasser, Tibor
Published in
IEEE transactions on electron devices
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2
Understanding and Modeling the Temperature Behavior of Hot-Carrier Degradation in SiON nMOSFETs
by
Tyaginov, Stanislav
,
Jech, Markus
,
Franco, Jacopo
,
Sharma, Prateek
,
Kaczer, Ben
,
Grasser, Tibor
Published in
IEEE electron device letters
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3
Mixed Hot-Carrier/Bias Temperature Instability Degradation Regimes in Full Bias Space: Implications and Peculiarities
by
Jech, Markus
,
Rott, Gunnar
,
Reisinger, Hans
,
Tyaginov, Stanislav
,
Rzepa, Gerhard
,
Grill, Alexander
,
Jabs, Dominic
,
Jungemann, Christoph
,
Waltl, Michael
,
Grasser, Tibor
Published in
IEEE transactions on electron devices
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4
Modeling of Hot-Carrier Degradation in nLDMOS Devices: Different Approaches to the Solution of the Boltzmann Transport Equation
by
Sharma, Prateek
,
Tyaginov, Stanislav
,
Wimmer, Yannick
,
Rudolf, Florian
,
Rupp, Karl
,
Bina, Markus
,
Enichlmair, Hubert
,
Jong-Mun Park
,
Minixhofer, Rainer
,
Ceric, Hajdin
,
Grasser, Tibor
Published in
IEEE transactions on electron devices
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5
Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics-Part II: Theory
by
Jech, Markus
,
Ullmann, Bianka
,
Rzepa, Gerhard
,
Tyaginov, Stanislav
,
Grill, Alexander
,
Waltl, Michael
,
Jabs, Dominic
,
Jungemann, Christoph
,
Grasser, Tibor
Published in
IEEE transactions on electron devices
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6
On the limits of applicability of drift-diffusion based hot carrier degradation modeling
by
Jech, Markus
,
Sharma, Prateek
,
Tyaginov, Stanislav
,
Rudolf, Florian
,
Grasser, Tibor
Published in
Japanese Journal of Applied Physics
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7
Bi-Modal Variability of nFinFET Characteristics During Hot-Carrier Stress: A Modeling Approach
by
Makarov, Alexander
,
Kaczer, Ben
,
Chasin, Adrian
,
Vandemaele, Michiel
,
Bury, Erik
,
Jech, Markus
,
Grill, Alexander
,
Hellings, Geert
,
El-Sayed, Al-Moatasem
,
Grasser, Tibor
,
Linten, Dimitri
,
Tyaginov, Stanislav
Published in
IEEE electron device letters
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8
On the importance of electron-electron scattering for hot-carrier degradation
by
Tyaginov, Stanislav
,
Bina, Markus
,
Franco, Jacopo
,
Wimmer, Yannick
,
Kaczer, Ben
,
Grasser, Tibor
Published in
Japanese Journal of Applied Physics
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9
Modeling of hot-carrier degradation in LDMOS devices using a drift-diffusion based approach
by
Sharma, Prateek
,
Jech, Markus
,
Tyaginov, Stanislav
,
Rudolf, Florian
,
Rupp, Karl
,
Enichlmair, Hubert
,
Jong-Mun Park
,
Grasser, Tibor
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Predictive and efficient modeling of hot-carrier degradation in nLDMOS devices
by
Sharma, Prateek
,
Tyaginov, Stanislav
,
Wimmer, Yannick
,
Rudolf, Florian
,
Rupp, Karl
,
Bina, Markus
,
Enichlmair, Hubert
,
Jong-Mun Park
,
Ceric, Hajdin
,
Grasser, Tibor
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10
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8
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8
Conference Proceedings
2
Journal Title
Ieee Transactions On Electron Devices
4
Ieee Electron Device Letters
2
Japanese Journal Of Applied Physics
2
Subjects
Degradation
Science & Technology
10
Engineering
8
Engineering, Electrical & Electronic
8
Physical Sciences
8
Physics
8
Physics, Applied
8
Stress
8
Technology
8
Hot-Carrier Degradation
7
Hot Carriers
7
Boltzmann Transport Equation
5
Devices
4
Mathematical Model
4
Reliability
4
Spherical Harmonics Expansion
4
Transistors
4
Drift-Diffusion Scheme
3
Logic Gates
3
Mathematical Analysis
3
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Science Citation Index Expanded (Web Of Science)
7
Ieee Electronic Library (Iel) Journals
6
Ieee Xplore All Journals
6
Ieee Open Access Journals
4
Institute Of Physics Iopscience Extra
2
Ieee Xplore All Conference Series
1
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