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1by Min Chen, Ebert, D., Hagen, H., Laramee, R.S., van Liere, R., Ma, K.-L., Ribarsky, W., Scheuermann, G., Silver, D.Get full text
Published in IEEE computer graphics and applications
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2by Tsai, Ming-Yi, Huang, P. S., Yeh, J. H., Liu, H. Y., Chao, Y. C., Tsai, Fila, Chen, D. L., Shih, M. K., Tarng, DavidGet full text
Published in IEEE transactions on device and materials reliability
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3by Luo, Laiqiang, Shubhakar, Kalya, Mei, Sen, Raghavan, Nagarajan, Liu, Binghai, Huang, Jing Yan, Liu, Youming, Zheng, Han, Zhang, Fan, Shum, Danny, Pey, K. L.Get full text
Published in IEEE transactions on device and materials reliability
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9by Merrill, W.M., Liu, H.L.N., Leong, J., Sohrabi, K., Pottie, G.J.Get full text
Published in IEEE antennas & propagation magazine
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