Search Results - Lin, Larry Liang-Chen

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    Electromigration immortality of purely intermetallic micro -bump for 3D integration

    Electromigration immortality of purely intermetallic micro -bump for 3D integration by Hsiao-Yun Chen, Chih-Hang Tung, Yi-Li Hsiao, Jyun-lin Wu, Tung-Ching Yeh, Lin, Larry Liang-Chen, Chih Chen, Yu, Douglas Cheng-Hua

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    Conference Proceeding
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