Search Results - Lin, Benson Tsu-Hung

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    Effect of oxidation on electromigration in 2-µm Cu redistribution lines capped with polyimide

    Effect of oxidation on electromigration in 2-µm Cu redistribution lines capped with polyimide by Tseng, I-Hsin, Hsu, Po-Ning, Hsu, Wei-You, Tran, Dinh-Phuc, Lin, Benson Tsu-Hung, Chang, Chia-Cheng, Tu, K.N., Chen, Chih

    Published in Results in physics
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