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Search Results - Krushelnitckii, A. N.
Search Results - Krushelnitckii, A. N.
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Specific Features of the Quantum-Size Effect in Transport Phenomena in Bismuth-Thin Films on Mica Substrates
by
Demidov, E. V.
,
Grabov, V. M.
,
Komarov, V. A.
,
Krushelnitckii, A. N.
,
Suslov, A. V.
,
Suslov, M. V.
Published in
Semiconductors (Woodbury, N.Y.)
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Measurement of the thickness of block-structured bismuth films by atomic-force microscopy combined with selective chemical etching
by
Demidov, E. V.
,
Komarov, V. A.
,
Krushelnitckii, A. N.
,
Suslov, A. V.
Published in
Semiconductors (Woodbury, N.Y.)
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Structure of bismuth films obtained using an array of identically oriented single-crystal bismuth islands preliminarily grown on a substrate
by
Grabov, V. M.
,
Demidov, E. V.
,
Ivanova, E. K.
,
Kablukova, N. S.
,
Krushelnitckii, A. N.
,
Senkevich, S. V.
Published in
Semiconductors (Woodbury, N.Y.)
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Dependence of the surface morphology of ultrathin bismuth films on mica substrates on the film thickness
by
Krushelnitckii, A. N.
,
Demidov, E. V.
,
Ivanova, E. K.
,
Kablukova, N. S.
,
Komarov, V. A.
Published in
Semiconductors (Woodbury, N.Y.)
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Journal Title
Semiconductors
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Subjects
Bismuth
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Magnetic Materials
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Magnetism
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Mica
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Physical Sciences
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Physics
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Physics And Astronomy
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Physics, Condensed Matter
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Science & Technology
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2016
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Materials Science
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November 15–16
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St. Petersburg
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Substrates
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3
Thickness
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3
Thin Films
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Xv International Conference “Thermoelectrics And Their Applications—2016”
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Atomic Force Microscopy
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2
Chemical Etching
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Evaporation
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Springer Link
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Science Citation Index Expanded (Web Of Science)
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Springerlink Contemporary
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