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High performance 65 nm SOI technology with dual stress liner and low capacitance SRAM cell
by
Leobandung, E.
,
Nayakama, H.
,
Mocuta, D.
,
Miyamoto, K.
,
Angyal, M.
,
Meer, H.V.
,
McStay, K.
,
Ahsan, I.
,
Allen, S.
,
Azuma, A.
,
Belyansky, M.
,
Bentum, R.-V.
,
Cheng, J.
,
Chidambarrao, D.
,
Dirahoui, B.
,
Fukasawa, M.
,
Gerhardt, M.
,
Gribelyuk, M.
,
Halle, S.
,
Harifuchi, H.
,
Harmon, D.
,
Heaps-Nelson, J.
,
Hichri, H.
,
Ida, K.
,
Inohara, M.
,
Inouc, I.C.
,
Jenkins, K.
,
Kawamura, T.
,
Kim, B.
,
Ku, S.-K.
,
Kumar, M.
,
Lane, S.
,
Liebmann, L.
,
Logan, R.
,
Melville, I.
,
Miyashita, K.
,
Mocuta, A.
,
O'Neil, P.
,
Ng, M.-F.
,
Nogami, T.
,
Nomura, A.
,
Norris, C.
,
Nowak, E.
,
Ono, M.
,
Panda, S.
,
Penny, C.
,
Radens, C.
,
Ramachandran, R.
,
Ray, A.
,
Rhee, S.-H.
,
Ryan, D.
,
Shinohara, T.
,
Sudo, G.
,
Sugaya, F.
,
Strane, J.
,
Tan, Y.
,
Tsou, L.
,
Wang, L.
,
Wirbeleit, F.
,
Wu, S.
,
Yamashita, T.
,
Yan, H.
,
Ye, Q.
,
Yoneyama, D.
,
Zamdmer, D.
,
Zhong, H.
,
Zhu, H.
,
Zhu, W.
,
Agnello, P.
,
Bukofsky, S.
,
Bronner, G.
,
Crabbe, E.
,
Freeman, G.
,
Huang, S.-F.
,
Ivers, T.
,
Kuroda, H.
,
McHerron, D.
,
Pellerin, J.
,
Toyoshima, Y.
,
Subbanna, S.
,
Kepler, N.
,
Su, L.
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A compilation of inflation and location indexes
by
Remer, Donald S.
,
Huynh, Leon
,
Agarwal, Kanishka
,
Auchard, Brian J.
,
Heaps-Nelson, Tom
Published in
International journal of production economics
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