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1by Anderson, B.E., Anderson, K., Charalambous, A., Cotta-Ramusino, A., Dallavalle, M., Evans, H., Eyring, A., Foucher, M., Giacomelli, R., Giles, A., Gross, S., Guillot, M., Gorlitz, W., Hammartstrom, R., Hart, J., Hart, P., Hillier, S., Jovanovic, P., Kawamoto, T., Kellogg, R.G., Lahmann, R., Mannelli, M., Mueller, U., Pilcher, J., Runolfsson, O., Schmitt, B., Springer, W., Strom, D., Tecchio, M., Wagner, D., Zankel, K.Get full text
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
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