Search Results - Grula, G.J.

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  1. 1
    Stress induced defects and transistor leakage for shallow trench isolated SOI

    Stress induced defects and transistor leakage for shallow trench isolated SOI by Sleight, J.W., Chnan Lin, Grula, G.J.

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  2. 2
    LOCOS-induced stress effects on thin-film SOI devices

    LOCOS-induced stress effects on thin-film SOI devices by Cheng-Liang Huang, Soleimani, H.R., Grula, G.J., Sleight, J.W., Villani, A., Ali, H., Antoniadis, D.A.

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  3. 3
    Degradation characteristics of STI and MESA-isolated thin-film SOI CMOS

    Degradation characteristics of STI and MESA-isolated thin-film SOI CMOS by Cheng-Liang Huang, Grula, G.J.

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  4. 4
    Comparison of shallow trench and LOCOS isolation for hot-carrier resistance

    Comparison of shallow trench and LOCOS isolation for hot-carrier resistance by Doyle, B.S., O'Connor, R.S., Mistry, K.R., Grula, G.J.

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