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Crystalline Gadolinium Oxide: A Promising High-k Candidate for Future CMOS Generations
by
Endres, Ralf
,
Gottlob, Heiner
,
Schmidt, Mathias
,
Schwendt, Dominik
,
Osten, H.-Jörg
,
Schwalke, Udo
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Electrical Properties of LaLuO 3 /Si(100) Structures Prepared by Molecular Beam Deposition
by
Gomeniuk, Yuri Y.
,
Gomeniuk, Yuri V.
,
Nazarov, Alexei N.
,
Hurley, Paul K.
,
Cherkaoui, Karim
,
Monaghan, Scott
,
Gottlob, Heiner
,
Schmidt, Mathias
,
Schubert, Jürgen
,
Lopes, J. Marcelo. J
,
Engström, Olof
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ECS transactions
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Impact of Al, Ni, and TiN Metal Gates On ZrO2-MOS Capacitors
by
Abermann, Stephan M.
,
Efavi, Joseph
,
Lugstein, Alois
,
Auer, Erwin
,
Gottlob, Heiner
,
Schmidt, Mathias
,
Lemme, Max
,
Bertagnolli, Emmerich
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The Formation and Characterisation of Lanthanum Oxide Based Si/High-k/NiSi Gate Stacks by Electron-Beam Evaporation: An Examination of In-Situ Amorphous Silicon Capping and NiSi fo...
by
Hurley, Paul
,
Pijolat, Mathieu
,
Cherkaoui, Karim
,
O'Connor, Eamon
,
O'Connell, Dan
,
Negara, Muhammad Adi
,
Lemme, Max C.
,
Gottlobb, Heiner D.
,
Schmidt, Mathias
,
Stegmaier, Katja
,
Schwalke, Udo
,
Hall, Stephen
,
O.Buiu, Octavian
,
Engstrom, Olof
,
Newcomb, Simon
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Institute Of Physics:jisc Collections:iop Publishing Read And Publish 2024-2025 (Reading List)
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