Showing
1 - 11
results of
11
Skip to content
VuFind
Log in
Library Catalogue Plus
Library
Subject guides
Databases
Referencing
Catalogue
Articles Plus
Keyword
Title
Author
Subject
Find
Advanced Search
Search Results - Gollhardt, N.
Search Results - Gollhardt, N.
Showing
1 - 11
results of
11
Refine Results
Sort
Relevance
Date Descending
Author
Title
1
Loading…
A STUDY OF FATIGUE AND CREEP BEHAVIOUR OF FOUR HIGH TEMPERATURE SOLDERS
by
Liang, J.
,
Gollhardt, N.
,
Lee, P. S.
,
Schroeder, S. A.
,
Morris, W. L.
Published in
Fatigue & fracture of engineering materials & structures
Get full text
Items that this one cites
Items that cite this one
Article
Save to List
Saved in:
2
Loading…
Heat transfer model for capacitor banks
by
Gasperi, M.L.
,
Gollhardt, N.
Request full text
Conference Proceeding
Save to List
Saved in:
3
Loading…
Junction Temperature Prediction of a Multiple-chip IGBT Module under DC Condition
by
Lixiang Wei
,
Kerkman, R.J.
,
Lukaszewski, R.A.
,
Brown, B.P.
,
Gollhardt, N.
,
Weiss, B.W.
Request full text
Conference Proceeding
Save to List
Saved in:
4
Loading…
Digital image correlation of nanoscale deformation fields for local stress measurement in thin films
by
Sabaté, N
,
Vogel, D
,
Gollhardt, A
,
Marcos, J
,
Gràcia, I
,
Cané, C
,
Michel, B
Published in
Nanotechnology
Get full text
Items that this one cites
Items that cite this one
Article
Save to List
Saved in:
5
Loading…
Residual Stress Measurement on a MEMS Structure With High-Spatial Resolution
by
Sabate, N.
,
Vogel, D.
,
Gollhardt, A.
,
Keller, J.
,
Cane, C.
,
Gracia, I.
,
Morante, J.R.
,
Michel, B.
Published in
Journal of microelectromechanical systems
Get full text
Items that this one cites
Items that cite this one
Article
Save to List
Saved in:
6
Loading…
FIB-based technique for stress characterization on thin films for reliability purposes
by
Sabaté, N.
,
Vogel, D.
,
Keller, J.
,
Gollhardt, A.
,
Marcos, J.
,
Gràcia, I.
,
Cané, C.
,
Michel, B.
Published in
Microelectronic engineering
Get full text
Items that this one cites
Items that cite this one
Article
Save to List
Saved in:
7
Loading…
Measurement of residual stress by slot milling with focused ion-beam equipment
by
Sabaté, N
,
Vogel, D
,
Gollhardt, A
,
Keller, J
,
Cané, C
,
Gràcia, I
,
Morante, J R
,
Michel, B
Published in
Journal of micromechanics and microengineering
Get full text
Items that this one cites
Items that cite this one
Article
Save to List
Saved in:
8
Loading…
Measurement of residual stresses in micromachined structures in a microregion
by
Sabaté, N.
,
Vogel, D.
,
Gollhardt, A.
,
Keller, J.
,
Michel, B.
,
Cané, C.
,
Gràcia, I.
,
Morante, J. R.
Published in
Applied physics letters
Get full text
Items that this one cites
Items that cite this one
Article
Save to List
Saved in:
9
Loading…
Measurement of residual stresses in micromachined structuresin a microregion
by
Sabaté, N.
,
Vogel, D.
,
Gollhardt, A.
,
Keller, J.
,
Michel, B.
,
Cané, C.
,
Gràcia, I.
,
Morante, J. R.
Published in
Applied physics letters
Get full text
Items that this one cites
Article
Save to List
Saved in:
10
Loading…
Localized Stress Measurements - A New Approach Covering Needs for Advanced Micro and Nanoscale System Development
by
Vogel, D.
,
Gollhardt, A.
,
Sabate, N.
,
Keller, J.
,
Michel, B.
,
Reichl, H.
Request full text
Conference Proceeding
Save to List
Saved in:
11
Loading…
APPLIED RESEARCH STUDY ON SATELLITE COMMUNICATIONS
by
EPSTEIN,M
,
Weinberg,M
,
Krause,I
,
Imboldi,E
,
Gollhardt,R
Request full text
Report
Save to List
Saved in:
Search Tools:
RSS Feed
Email Search
Save Search
Back
Refine Results
Page will reload when a filter is selected or excluded.
Limit To
Peer Reviewed
7 results
7
Full Text
11 results
11
Format
Articles
7 results
7
Conference Proceedings
3 results
3
Reports
1 results
1
Journal Title
Applied Physics Letters
2 results
2
Fatigue & Fracture Of Engineering Materials & Structures
1 results
1
Journal Of Microelectromechanical Systems
1 results
1
Journal Of Micromechanics And Microengineering
1 results
1
Microelectronic Engineering
1 results
1
Nanotechnology
1 results
1
Subjects
Science & Technology
8 results
8
Technology
8 results
8
Engineering
7 results
7
Engineering, Electrical & Electronic
6 results
6
Exact Sciences And Technology
4 results
4
Nanoscience & Nanotechnology
4 results
4
Physical Sciences
4 results
4
Physics
4 results
4
Physics, Applied
4 results
4
Science & Technology - Other Topics
4 results
4
Applied Sciences
3 results
3
Materials Science
3 results
3
Materials Science, Multidisciplinary
3 results
3
Electronics
2 results
2
Engineering, Mechanical
2 results
2
Instruments & Instrumentation
2 results
2
Ion Beams
2 results
2
Mechanical Instruments, Equipment And Techniques
2 results
2
Microelectronic Fabrication
2 results
2
Micromechanical Devices
2 results
2
Year of Publication
From:
To:
Source
Science Citation Index Expanded (Web Of Science)
5 results
5
Ieee Electronic Library (Iel) Conference Proceedings
3 results
3
Ieee Xplore All Conference Series
3 results
3
American Institute Of Physics:jisc Collections:transitional Journals Agreement 2021-23 (Reading List)
2 results
2
Institute Of Physics:jisc Collections:iop Publishing Read And Publish 2024-2025 (Reading List)
2 results
2
Aip Digital Archive
2 results
2
Institute Of Physics Iop Science Extra
2 results
2
Aip Journals (American Institute Of Physics)
2 results
2
Wiley Online Library Backfiles Complete
1 results
1
Wiley Online Library
1 results
1
Dtic Technical Reports
1 results
1
Institute Of Physics:jisc Collections:iop Publishing Journal Archive 1874-1998 (Access Period 2020 To 2024)
1 results
1
Wiley-Blackwell Journals
1 results
1
Sciencedirect Journals
1 results
1
Sciencedirect Freedom Collection 2022-2024
1 results
1
Ieee Electronic Library (Iel) Journals
1 results
1
Ieee Xplore All Journals
1 results
1
Backfile Package - Computer Science (Legacy) [Ycs]
1 results
1
Backfile Package - Engineering And Technology [Yen]
1 results
1
Sciencedirect Backfile Package - Materials Science [Yms]
1 results
1