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Search Results - Friendlich, M.R.
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Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM
by
Heidel, D.F.
,
Marshall, P.W.
,
LaBel, K.A.
,
Schwank, J.R.
,
Rodbell, K.P.
,
Hakey, M.C.
,
Berg, M.D.
,
Dodd, P.E.
,
Friendlich, M.R.
,
Phan, A.D.
,
Seidleck, C.M.
,
Shaneyfelt, M.R.
,
Xapsos, M.A.
Published in
IEEE transactions on nuclear science
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Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs
by
Tipton, A.D.
,
Pellish, J.A.
,
Hutson, J.M.
,
Baumann, R.
,
Deng, X.
,
Marshall, A.
,
Xapsos, M.A.
,
Kim, H.S.
,
Friendlich, M.R.
,
Campola, M.J.
,
Seidleck, C.M.
,
LaBel, K.A.
,
Mendenhall, M.H.
,
Reed, R.A.
,
Schrimpf, R.D.
,
Weller, R.A.
,
Black, J.D.
Published in
IEEE transactions on nuclear science
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Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions
by
Sierawski, B.D.
,
Pellish, J.A.
,
Reed, R.A.
,
Schrimpf, R.D.
,
Warren, K.M.
,
Weller, R.A.
,
Mendenhall, M.H.
,
Black, J.D.
,
Tipton, A.D.
,
Xapsos, M.A.
,
Baumann, R.C.
,
Xiaowei Deng
,
Campola, M.J.
,
Friendlich, M.R.
,
Kim, H.S.
,
Phan, A.M.
,
Seidleck, C.M.
Published in
IEEE transactions on nuclear science
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Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM
by
Heidel, D.F.
,
Marshall, P.W.
,
Pellish, J.A.
,
Rodbell, K.P.
,
LaBel, K.A.
,
Schwank, J.R.
,
Rauch, S.E.
,
Hakey, M.C.
,
Berg, M.D.
,
Castaneda, C.M.
,
Dodd, P.E.
,
Friendlich, M.R.
,
Phan, A.D.
,
Seidleck, C.M.
,
Shaneyfelt, M.R.
,
Xapsos, M.A.
Published in
IEEE transactions on nuclear science
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TID and SEE Response of Advanced Samsung and Micron 4G NAND Flash Memories for the NASA MMS Mission
by
Oldham, T.R.
,
Friendlich, M.R.
,
Sanders, A.B.
,
Seidleck, C.M.
,
Kim, H.S.
,
Berg, M.D.
,
LaBel, K.A.
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TPA Laser and Heavy-Ion SEE Testing: Complementary Techniques for SDRAM Single-Event Evaluation
by
Ladbury, R.L.
,
Benedetto, J.
,
McMorrow, D.
,
Buchner, S.P.
,
Label, K.A.
,
Berg, M.D.
,
Kim, H.S.
,
Sanders, A.B.
,
Friendlich, M.R.
,
Phan, A.
Published in
IEEE transactions on nuclear science
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TID and SEE Response of Advanced 4G NAND Flash Memories
by
Oldham, T.R.
,
Suhail, M.
,
Friendlich, M.R.
,
Carts, M.A.
,
Ladbury, R.L.
,
Kim, H.S.
,
Berg, M.D.
,
Poivey, C.
,
Buchner, S.P.
,
Sanders, A.B.
,
Seidleck, C.M.
,
LaBel, K.A.
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Conference Proceeding
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