Search Results - Fesič, V.

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  1. 1
    Take-off angle dependence of secondary ion signal intensity

    Take-off angle dependence of secondary ion signal intensity by Fesič, V, Veselý, M

    Published in Vacuum
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  2. 2
    Estimation of the depth resolution of secondary ion mass spectrometry at the interface SiO2/Si

    Estimation of the depth resolution of secondary ion mass spectrometry at the interface SiO2/Si by Kocanda, J., Fesič, V., Veselý, M., Breza, J., Kadlečíková, M.

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