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9by Shi, S.-T., Liu, R., Evans, A., Li, X.-T., Zheng, Y.-L., Chen, L., Glorieux, M., Sanchez, A.J., Wong, R., Wen, S.-J., Cunha, J., Guo, G., Ferlet-Cavrois, V., Summerer, L., Entrena, L.Get full text
Published in Microelectronics and reliability
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10by Evans, N.D., Moyse, H.A.J., Lowe, D., Briggs, D., Higgins, R., Mitchell, D., Zehnder, D., Chappell, M.J.Get full text
Published in Automatica (Oxford)
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