Search Results - Dianoux, Raphaelle

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  1. 1
    In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures

    In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures by Niehuis, Ewald, Moellers, Rudolf, Kollmer, Felix, Arlinghaus, Henrik, Bernard, Laetita, Josef Hug, Hans, Vranjkovic, Sasa, Dianoux, Raphaelle, Scheidemann, Adi

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    Characterisation of trapped electric charge carriers behaviour at nanometer scale by electrostatic force microscopy

    Characterisation of trapped electric charge carriers behaviour at nanometer scale by electrostatic force microscopy by Marchi, F., Dianoux, R., Smilde, H.J.H., Mur, P., Comin, F., Chevrier, J.

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    Charging dynamics and strong localization of a two-dimensional electron cloud

    Charging dynamics and strong localization of a two-dimensional electron cloud by Dianoux, R, Smilde, H J H, Marchi, F, Buffet, N, Mur, P, Comin, F, Chevrier, J

    Published in Nanotechnology
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