Search Results - Daharsh, R.

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  1. 1
    IEEE Std 4 "High voltage testing techniques" past, present and future IEEE/PES/PSIM High Voltage Testing Techniques Subcommittee Report

    IEEE Std 4 "High voltage testing techniques" past, present and future IEEE/PES/PSIM High Voltage Testing Techniques Subcommittee Report by Larzelere, B., Loving, K., Daharsh, R., Kise, J., McComb, T., Hanique, E., Britton, J., Molden, A., Holst, B., Coffeen, L., McQuin, N., Nichols, D., Dufield, D., Newnam, R., Schneider, H., Fitzpatrick, G., Schneider, G., Sebo, S., Hildreth, J., Schweickart, D., Train, D., Kremer, R., Smith, M., Wagenaar, L., Kuffel, J., So, E., Ward, B., McBride, J., Tuli, S., Yicheng Wang, Yixin Zhang, Hugh Zhu, Rickmann, J.

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    Dimethyl sulfoxide effects on hERG channels expressed in HEK293 cells

    Dimethyl sulfoxide effects on hERG channels expressed in HEK293 cells by Du, Xiaoyi, Lu, Daniel, Daharsh, Eric D., Yao, Aizhen, Dewoody, Rebecca, Yao, Jian-An

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    Self-estimated task persistence as a nonlinear predictor of college success

    Self-estimated task persistence as a nonlinear predictor of college success by Goldman, Roy D, Hudson, David, Daharsh, Billie J

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