Search Results - Chichester, R.J.

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  1. 1
    Scanning Single-Electron Transistor Microscopy: Imaging Individual Charges

    Scanning Single-Electron Transistor Microscopy: Imaging Individual Charges by Yoo, M. J., Fulton, T. A., Hess, H. F., Willett, R. L., Dunkleberger, L. N., Chichester, R. J., Pfeiffer, L. N., West, K. W.

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  2. 2
    Scanning single-electron transistor microscopy: Imaging individual charges

    Scanning single-electron transistor microscopy: Imaging individual charges by Yoo, M.J., Fulton, T.A., Hess, H.F., Willett, R.L., Dunkleberger, L.N., Chichester, R.J., Pfeiffer, L.N., West, K.W.

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  3. 3
    60 percent efficiency second harmonic generation from 12.8 μm radiation

    60 percent efficiency second harmonic generation from 12.8 μm radiation by Shaw, E.D., Patel, C.K.N., Chichester, R.J.

    Published in Optics communications
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