Showing
1 - 8
results of
8
Skip to content
VuFind
Log in
Library Catalogue Plus
Library
Subject guides
Databases
Referencing
Catalogue
Articles Plus
Keyword
Title
Author
Subject
Find
Advanced Search
Search Results - Cha, Sanguhn
Search Results - Cha, Sanguhn
Showing
1 - 8
results of
8
Refine Results
Sort
Relevance
Date Descending
Author
Title
1
Loading…
Efficient Implementation of Single Error Correction and Double Error Detection Code with Check Bit Pre-computation for Memories
by
Cha, Sanguhn
,
Yoon, Hongil
Published in
Journal of semiconductor technology and science
Get full text
Items that this one cites
Items that cite this one
Article
Save to List
Saved in:
2
Loading…
Defect Analysis and Cost-Effective Resilience Architecture for Future DRAM Devices
by
Cha, Sanguhn
,
Seongil, O.
,
Shin, Hyunsung
,
Hwang, Sangjoon
,
Park, Kwangil
,
Jang, Seong Jin
,
Choi, Joo Sun
,
Jin, Gyo Young
,
Son, Young Hoon
,
Cho, Hyunyoon
,
Ahn, Jung Ho
,
Kim, Nam Sung
Request full text
Conference Proceeding
Save to List
Saved in:
3
Loading…
Efficient Implementation of Single Error Correction and Double Error Detection Code with Check Bit Precomputation for Memories
by
Sanguhn Cha
,
Hongil Yoon
Published in
Journal of semiconductor technology and science
Get full text
Article
Save to List
Saved in:
4
Loading…
22.1 A 1.1V 16GB 640GB/s HBM2E DRAM with a Data-Bus Window-Extension Technique and a Synergetic On-Die ECC Scheme
by
Oh, Chi-Sung
,
Chun, Ki Chul
,
Byun, Young-Yong
,
Kim, Yong-Ki
,
Kim, So-Young
,
Ryu, Yesin
,
Park, Jaewon
,
Kim, Sinho
,
Cha, Sanguhn
,
Shin, Donghak
,
Lee, Jungyu
,
Son, Jong-Pil
,
Ho, Byung-Kyu
,
Cho, Seong-Jin
,
Kil, Beomyong
,
Ahn, Sungoh
,
Lim, Baekmin
,
Park, Yongsik
,
Lee, Kijun
,
Lee, Myung-Kyu
,
Baek, Seungduk
,
Noh, Junyong
,
Lee, Jae-Wook
,
Lee, Seungseob
,
Kim, Sooyoung
,
Lim, Botak
,
Choi, Seouk-Kyu
,
Kim, Jin-Guk
,
Choi, Hye-In
,
Kwon, Hyuk-Jun
,
Kong, Jun Jin
,
Sohn, Kyomin
,
Kim, Nam Sung
,
Park, Kwang-Il
,
Lee, Jung-Bae
Request full text
Conference Proceeding
Save to List
Saved in:
5
Loading…
A 16Gb LPDDR4X SDRAM with an NBTI-tolerant circuit solution, an SWD PMOS GIDL reduction technique, an adaptive gear-down scheme and a metastable-free DQS aligner in a 10nm class DR...
by
Ki Chul Chun
,
Yong-Gyu Chu
,
Jin-Seok Heo
,
Tae-Sung Kim
,
Soohwan Kim
,
Hui-Kap Yang
,
Mi-Jo Kim
,
Chang-Kyo Lee
,
Juhwan Kim
,
Hyunchul Yoon
,
Chang-Ho Shin
,
Sanguhn Cha
,
Hyung-Jin Kim
,
Young-Sik Kim
,
Kyungryun Kim
,
Young-Ju Kim
,
Wonjun Choi
,
Dae-Sik Yim
,
Inkyu Moon
,
Junha Lee
,
Young Choi
,
Yongmin Kwon
,
Sung-Won Choi
,
Jung-Wook Kim
,
Yoon-Suk Park
,
Woongdae Kang
,
Jinil Chung
,
Seunghyun Kim
,
Yesin Ryu
,
Seong-Jin Cho
,
Hoon Shin
,
Hangyun Jung
,
Sanghyuk Kwon
,
Kyuchang Kang
,
Jongmyung Lee
,
Yujung Song
,
Young-Jae Kim
,
Eun-Ah Kim
,
Kyung-Soo Ha
,
Kyoung-Ho Kim
,
Seok-Hun Hyun
,
Seungbum Ko
,
Jung-Hwan Choi
,
Young-Soo Sohn
,
Kwang-Il Park
,
Seong-Jin Jang
Request full text
Conference Proceeding
Save to List
Saved in:
6
Loading…
Efficient Implementation of Single Error Correction and Double Error Detection Code with Check Bit Pre-computation for Memories
by
Cha, Sanguhn
,
Yoon, Hongil
Published in
Journal of semiconductor technology and science
Get full text
Article
Save to List
Saved in:
7
Loading…
Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories
by
Cha, Sanguhn
,
Yoon, Hongil
Published in
IEEE transactions on device and materials reliability
Get full text
Items that this one cites
Items that cite this one
Magazinearticle
Save to List
Saved in:
8
Loading…
Single-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays for Word-Oriented Memories
by
Cha, Sanguhn
,
Yoon, Hongil
Published in
IEEE transactions on device and materials reliability
Get full text
Items that this one cites
Items that cite this one
Magazinearticle
Save to List
Saved in:
Search Tools:
RSS Feed
Email Search
Save Search
Back
Refine Results
Page will reload when a filter is selected or excluded.
Limit To
Peer Reviewed
2 results
2
Full Text
8 results
8
Format
Articles
3 results
3
Conference Proceedings
3 results
3
Magazine Articles
2 results
2
Journal Title
Journal Of Semiconductor Technology And Science
3 results
3
Ieee Transactions On Device And Materials Reliability
2 results
2
Subjects
Engineering
6 results
6
Engineering, Electrical & Electronic
6 results
6
Science & Technology
6 results
6
Technology
6 results
6
Error Correction Codes
5 results
5
Error Correction Code
3 results
3
Physical Sciences
3 results
3
Physics
3 results
3
Physics, Applied
3 results
3
Arrays
2 results
2
Fault Model
2 results
2
Generators
2 results
2
Hardware
2 results
2
Memory Test
2 results
2
Random Access Memory
2 results
2
Testing
2 results
2
Transistors
2 results
2
Word-Oriented Memory
2 results
2
Accelerators
1 results
1
Artificial Intelligence
1 results
1
Year of Publication
From:
To:
Source
Ieee Electronic Library (Iel) Conference Proceedings
3 results
3
Ieee Xplore All Conference Series
3 results
3
Freely Accessible Journals
3 results
3
Science Citation Index Expanded (Web Of Science)
3 results
3
Full-Text Journals In Chemistry (Open Access)
3 results
3
Ezb Electronic Journals Library
3 results
3
Ieee Electronic Library (Iel) Journals
2 results
2
Ieee Xplore All Journals
2 results
2