Showing
1 - 3
results of
3
Skip to content
VuFind
Log in
Library Catalogue Plus
Library
Subject guides
Databases
Referencing
Catalogue
Articles Plus
Keyword
Title
Author
Subject
Find
Advanced Search
Search Results - Buda, E.C.
Search Results - Buda, E.C.
Showing
1 - 3
results of
3
Refine Results
Sort
Relevance
Date Descending
Author
Title
1
Loading…
A Bipolar-Selected Phase Change Memory Featuring Multi-Level Cell Storage
by
Bedeschi, F.
,
Fackenthal, R.
,
Resta, C.
,
Donze, E.M.
,
Jagasivamani, M.
,
Buda, E.C.
,
Pellizzer, F.
,
Chow, D.W.
,
Cabrini, A.
,
Calvi, G.
,
Faravelli, R.
,
Fantini, A.
,
Torelli, G.
,
Mills, D.
,
Gastaldi, R.
,
Casagrande, G.
Published in
IEEE journal of solid-state circuits
Get full text
Items that this one cites
Items that cite this one
Article
Save to List
Saved in:
2
Loading…
4-Mb MOSFET-selected /spl mu/trench phase-change memory experimental chip
by
Bedeschi, F.
,
Bez, R.
,
Boffino, C.
,
Bonizzoni, E.
,
Buda, E.C.
,
Casagrande, G.
,
Costa, L.
,
Ferraro, M.
,
Gastaldi, R.
,
Khouri, O.
,
Ottogalli, F.
,
Pellizzer, F.
,
Pirovano, A.
,
Resta, C.
,
Torelli, G.
,
Tosi, M.
Published in
IEEE journal of solid-state circuits
Get full text
Items that this one cites
Items that cite this one
Article
Save to List
Saved in:
3
Loading…
4-Mb MOSFET-selected [micro]trench phase-change memory experimental chip
by
Bedeschi, F
,
Bez, R
,
Boffino, C
,
Bonizzoni, E
,
Buda, E.C
,
Casagrande, G
,
Costa, L
,
Ferraro, M
,
Gastaldi, R
,
Khouri, O
,
Ottogalli, F
,
Pellizzer, F
,
Pirovano, A
,
Resta, C
,
Torelli, G
,
Tosi, M
Published in
IEEE journal of solid-state circuits
Get full text
Article
Save to List
Saved in:
Search Tools:
RSS Feed
Email Search
Save Search
Back
Refine Results
Page will reload when a filter is selected or excluded.
Limit To
Peer Reviewed
3 results
3
Full Text
3 results
3
Format
Articles
3 results
3
Journal Title
Ieee Journal Of Solid-State Circuits
3 results
3
Subjects
Current Distribution
2 results
2
Phase Change Materials
2 results
2
Phase Change Memory
2 results
2
Semiconductor Device Measurement
2 results
2
Applied Sciences
1 results
1
Cascode Bitline Biasing
1 results
1
Circuits
1 results
1
Cmos Technology
1 results
1
Current Measurement
1 results
1
Cycles
1 results
1
Design. Technologies. Operation Analysis. Testing
1 results
1
Durability
1 results
1
Electrical Resistance Measurement
1 results
1
Electronics
1 results
1
Endurance
1 results
1
Engineering
1 results
1
Engineering, Electrical & Electronic
1 results
1
Exact Sciences And Technology
1 results
1
Feasibility
1 results
1
Flash Memory
1 results
1
Year of Publication
From:
To:
Source
Ieee Electronic Library (Iel) Journals
3 results
3
Ieee Xplore All Journals
3 results
3
Science Citation Index Expanded (Web Of Science)
1 results
1