Search Results - Bezirganyan, Petros H.

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  1. 1
    Determination of particle-induced structural disorder depth profile in crystals using the grazing-angle incidence hard x-ray backscattering diffraction technique

    Determination of particle-induced structural disorder depth profile in crystals using the grazing-angle incidence hard x-ray backscattering diffraction technique by Bezirganyan, Hakob (Jacob) P, Bezirganyan, Siranush E, Bezirganyan, Petros H, Bezirganyan, Hayk H

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  2. 2
    Specular beam suppression and enhancement phenomena in the case of grazing-angle incidence X-rays backdiffraction by the crystal with stacking fault

    Specular beam suppression and enhancement phenomena in the case of grazing-angle incidence X-rays backdiffraction by the crystal with stacking fault by Bezirganyan, Hakob (Akop) P., Bezirganyan, Hayk H., Bezirganyan, Siranush E., Bezirganyan, Petros H.

    Published in Optics communications
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  3. 3
    Amplification of specular x-rays caused by grazing-angle incidence backscattering diffraction in epitaxial bi-layer grown on relaxed crystalline substrate

    Amplification of specular x-rays caused by grazing-angle incidence backscattering diffraction in epitaxial bi-layer grown on relaxed crystalline substrate by Bezirganyan, Hakob (Akop) P, Bezirganyan, Siranush E, Bezirganyan Jr, Petros H, Bezirganyan Jr, Hayk H

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