Search Results - Berlingard, Q.

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  1. 1
    RF performance of Standard, High-Resistivity and Trap-Rich Silicon substrates down to cryogenic temperature

    RF performance of Standard, High-Resistivity and Trap-Rich Silicon substrates down to cryogenic temperature by Berlingard, Q., Moulin, M., Michel, J.-P., Fache, T., Charlet, I., Plantier, C., Chalupa, Z., Lugo-Alvarez, J., Raskin, J.-P., Hutin, L., Casse, M.

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  2. 2
    RF performance enhancement of 28nm FD-SOI transistors down to cryogenic temperature using back biasing

    RF performance enhancement of 28nm FD-SOI transistors down to cryogenic temperature using back biasing by Berlingard, Q., Lugo-Alvarez, J., Bawedin, M., Puyal, V., Bergamaschi, F., Casse, M.

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  3. 3
    Sub-10-GHz Cryo-CMOS LNAs Achieving Up to 0.07-dB Average NF Thanks to Back Biasing for Qubit Readout in 28-nm FD-SOI

    Sub-10-GHz Cryo-CMOS LNAs Achieving Up to 0.07-dB Average NF Thanks to Back Biasing for Qubit Readout in 28-nm FD-SOI by Puyal, V., Berlingard, Q., Lugo-Alvarez, J., Blampey, B., Cass, M., Belot, D.

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  4. 4
    FDSOI for cryoCMOS electronics: device characterization towards compact model

    FDSOI for cryoCMOS electronics: device characterization towards compact model by Casse, M., Paz, B. Cardoso, Bergamaschi, F., Ghibaudo, G., Serra, F., Billiot, G., Jansen, A. G. M., Berlingard, Q., Martinie, S., Bedecarrats, T., Contamin, L., Juge, A., Vincent, E., Galy, P., Pavanello, M.A, Vinet, M., Meunier, T., Gaillard, F.

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